A flat transducer was constructed, using a 9-μm-thick PVDF (polyvinylidene fluoride) film for generation and detection of high-frequency ultrasonic waves, and used for measurements of the phase velocity of longitudinal waves traveling along the thickness direction in a very thin material. The transducer has a useful wideband frequency characteristic extending from 10 MHz to over 150 MHz. Measurements of the phase velocity of the longitudinal waves are carried out using a 0.212-mm-thick glass slide and a 0.102-mm-thick stainless-steel shim, using water as a coupling medium. The thickness limit for this measurement appears to be approximately 20 μm. The phase velocity of the longitudinal mode is obtained as a function of frequency in the frequency domain by using a modified sampled continuous wave (cw) technique. It can also be measured in the time domain by using a broadband pulse of short duration.
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September 2003
August 27 2003
Measurements of the longitudinal wave speed in thin materials using a wideband PVDF transducer
Kwang Yul Kim;
Kwang Yul Kim
Department of Theoretical and Applied Mechanics, Cornell University, Ithaca, New York 14853
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Wei Zou;
Wei Zou
Department of Theoretical and Applied Mechanics, Cornell University, Ithaca, New York 14853
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Steve Holland;
Steve Holland
Department of Theoretical and Applied Mechanics, Cornell University, Ithaca, New York 14853
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Wolfgang Sachse
Wolfgang Sachse
Department of Theoretical and Applied Mechanics, Cornell University, Ithaca, New York 14853
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J. Acoust. Soc. Am. 114, 1450–1453 (2003)
Article history
Received:
September 07 2001
Accepted:
January 30 2003
Citation
Kwang Yul Kim, Wei Zou, Steve Holland, Wolfgang Sachse; Measurements of the longitudinal wave speed in thin materials using a wideband PVDF transducer. J. Acoust. Soc. Am. 1 September 2003; 114 (3): 1450–1453. https://doi.org/10.1121/1.1562650
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