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Journal Articles

Anatomy of internal electric field profile in operating SiC power MOSFETs with local contact potential probing

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Mingsheng Fang, Yan Liu, Ting Zhang, Dandan Wang, Zhihong Mai, Guozhong Xing
Journal: Applied Physics Letters
Appl. Phys. Lett. 126, 173504 (2025)
https://doi.org/10.1063/5.0259120
Published: April 2025
View articletitled, Anatomy of internal electric field profile in operating SiC power MOSFETs with local contact potential probing
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Observation of photoelectric-induced microplasma avalanche breakdown in AlGaN ultraviolet photodiode with separate absorption and multiplication structure

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Jiying Cao, Qing Cai, Haifan You, Pengfei Shao, Jin Wang, Hui Guo, Junjun Xue, Bin Liu, Zili Xie, Xun Cao, Hai Lu, Youdou Zheng, Rong Zhang, Dunjun Chen
Journal: Applied Physics Letters
Appl. Phys. Lett. 123, 121109 (2023)
https://doi.org/10.1063/5.0155244
Published: September 2023
View articletitled, Observation of photoelectric-induced microplasma avalanche breakdown in AlGaN ultraviolet photodiode with separate absorption and multiplication structure
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Journal Articles

Vector electric field measurement via position-modulated Kelvin probe force microscopy

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Ryan P. Dwyer, Louisa M. Smieska, Ali Moeed Tirmzi, John A. Marohn
Journal: Applied Physics Letters
Appl. Phys. Lett. 111, 173106 (2017)
https://doi.org/10.1063/1.4999172
Published: October 2017
View articletitled, Vector electric field measurement via position-modulated Kelvin probe force microscopy
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Includes: Supplementary data
Journal Articles

Effect of lateral tip motion on multifrequency atomic force microscopy

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Joseph L. Garrett, Lisa J. Krayer, Kevin J. Palm, Jeremy N. Munday
Journal: Applied Physics Letters
Appl. Phys. Lett. 111, 043105 (2017)
https://doi.org/10.1063/1.4996720
Published: July 2017
View articletitled, Effect of lateral tip motion on multifrequency atomic force microscopy
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Journal Articles

Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

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Yoichi Miyahara, Peter Grutter
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 163103 (2017)
https://doi.org/10.1063/1.4981937
Published: April 2017
View articletitled, Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
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Includes: Supplementary data
Journal Articles

Kelvin-probe force microscopy of the pH-dependent charge of functional groups

Open Access
Alexander D. D. Stone, Patrick Mesquida
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 233702 (2016)
https://doi.org/10.1063/1.4953571
Published: June 2016
View articletitled, Kelvin-probe force microscopy of the pH-dependent charge of functional groups
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Includes: Supplementary data
Journal Articles

Silver nanoparticles with tunable work functions

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Pangpang Wang, Daisuke Tanaka, Sou Ryuzaki, Shohei Araki, Koichi Okamoto, Kaoru Tamada
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 151601 (2015)
https://doi.org/10.1063/1.4933253
Published: October 2015
View articletitled, Silver nanoparticles with tunable work functions
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Journal Articles

Direct writing the selective emitter of solar cell with lateral ultrasonic spray laser doping technique

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Jingwei Song (宋经纬), Xuemeng Wang (王学孟), Li Gong (龚力), Yanghuan Lin (林杨欢), Xiaodong Gao (高晓东), Jiapei Huang (黄嘉培), Hui Shen (沈辉)
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 143901 (2015)
https://doi.org/10.1063/1.4931627
Published: October 2015
View articletitled, Direct writing the selective emitter of solar cell with lateral ultrasonic spray laser doping technique
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Journal Articles

Surface modifications with Lissajous trajectories using atomic force microscopy

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Wei Cai, Nan Yao
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 113102 (2015)
https://doi.org/10.1063/1.4931087
Published: September 2015
View articletitled, Surface modifications with Lissajous trajectories using atomic force microscopy
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Journal Articles

Measurement of the electrostatic edge effect in wurtzite GaN nanowires

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Alex Henning, Benjamin Klein, Kris A. Bertness, Paul T. Blanchard, Norman A. Sanford, Yossi Rosenwaks
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 213107 (2014)
https://doi.org/10.1063/1.4902873
Published: November 2014
View articletitled, Measurement of the electrostatic edge effect in wurtzite GaN nanowires
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Journal Articles

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

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Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist, Per-Anders Thorén, Olle Inganäs, David B. Haviland
Journal: Applied Physics Letters
Appl. Phys. Lett. 105, 143113 (2014)
https://doi.org/10.1063/1.4897966
Published: October 2014
View articletitled, Intermodulation electrostatic force microscopy for imaging surface photo-voltage
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Journal Articles

Thickness mapping of high-κ dielectrics at the nanoscale

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J. Trapnauskas, M. Rommel, A. J. Bauer, L. Frey
Journal: Applied Physics Letters
Appl. Phys. Lett. 104, 052907 (2014)
https://doi.org/10.1063/1.4863947
Published: February 2014
View articletitled, Thickness mapping of high-κ dielectrics at the nanoscale
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Includes: Supplementary data
Journal Articles

Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope

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Roland Nowak, Daniel Moraru, Takeshi Mizuno, Ryszard Jablonski, Michiharu Tabe
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 083109 (2013)
https://doi.org/10.1063/1.4794406
Published: March 2013
View articletitled, Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope
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Journal Articles

Physisorption of functionalized gold nanoparticles on AlGaN/GaN high electron mobility transistors for sensing applications

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M. S. Makowski, S. Kim, M. Gaillard, D. Janes, M. J. Manfra, I. Bryan, Z. Sitar, C. Arellano, J. Xie, R. Collazo, A. Ivanisevic
Journal: Applied Physics Letters
Appl. Phys. Lett. 102, 074102 (2013)
https://doi.org/10.1063/1.4791788
Published: February 2013
View articletitled, Physisorption of functionalized gold nanoparticles on AlGaN/GaN high electron mobility transistors for sensing applications
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Journal Articles

Mapping the surface charge distribution of amyloid fibril

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Gyudo Lee, Wonseok Lee, Hyungbeen Lee, Sang Woo Lee, Dae Sung Yoon, Kilho Eom, Taeyun Kwon
Journal: Applied Physics Letters
Appl. Phys. Lett. 101, 043703 (2012)
https://doi.org/10.1063/1.4739494
Published: July 2012
View articletitled, Mapping the surface charge distribution of amyloid fibril
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Includes: Supplementary data
Journal Articles

Direct measurement of surface states density and energy distribution in individual InAs nanowires

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E. Halpern, G. Elias, A. V. Kretinin, H. Shtrikman, Y. Rosenwaks
Journal: Applied Physics Letters
Appl. Phys. Lett. 100, 262105 (2012)
https://doi.org/10.1063/1.4731211
Published: June 2012
View articletitled, Direct measurement of surface states density and energy distribution in individual InAs nanowires
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Journal Articles

High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy

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Yasuhiro Sugawara, Lili Kou, Zongmin Ma, Takeshi Kamijo, Yoshitaka Naitoh, Yan Jun Li
Journal: Applied Physics Letters
Appl. Phys. Lett. 100, 223104 (2012)
https://doi.org/10.1063/1.4723697
Published: May 2012
View articletitled, High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy
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Journal Articles

Effect of electron injection into phosphorus donors in silicon-on-insulator channel observed by Kelvin probe force microscopy

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Miftahul Anwar, Roland Nowak, Daniel Moraru, Arief Udhiarto, Takeshi Mizuno, Ryszard Jablonski, Michiharu Tabe
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 213101 (2011)
https://doi.org/10.1063/1.3663624
Published: November 2011
View articletitled, Effect of electron injection into phosphorus donors in silicon-on-insulator channel observed by Kelvin probe force microscopy
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Journal Articles

Electrical study of trapped charges in nanoscale Ge islands by Kelvin probe force microscopy for nonvolatile memory applications

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Z. Lin, P. Brunkov, F. Bassani, G. Bremond
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 263112 (2010)
https://doi.org/10.1063/1.3533259
Published: December 2010
View articletitled, Electrical study of trapped charges in nanoscale Ge islands by Kelvin probe force microscopy for nonvolatile memory applications
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Journal Articles

Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces

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Carl Leung, Dario Maradan, Armin Kramer, Stefan Howorka, Patrick Mesquida, Bart W. Hoogenboom
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 203703 (2010)
https://doi.org/10.1063/1.3512867
Published: November 2010
View articletitled, Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces
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Includes: Supplementary data