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Journal Articles

Dependence of spontaneous polarization on stacking sequence in SiC revealed by local Schottky barrier height variations over a partially formed 8H-SiC layer on a 4H-SiC substrate

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Kibog Park, Heung Seok Go, Youngeun Jeon, Jonathan P. Pelz, Xuan Zhang, Marek Skowronski
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 252102 (2011)
https://doi.org/10.1063/1.3670329
Published: December 2011
View articletitled, Dependence of spontaneous polarization on stacking sequence in SiC revealed by local Schottky barrier height variations over a partially formed 8H-SiC layer on a 4H-SiC substrate
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Journal Articles

Hot electron transmission in metals using epitaxial NiSi2/n-Si(111) interfaces

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S. Parui, B. Wit, L. Bignardi, P. Rudolf, B. Kooi, B. J. van Wees, T. Banerjee
Journal: Applied Physics Letters
Appl. Phys. Lett. 99, 032104 (2011)
https://doi.org/10.1063/1.3610458
Published: July 2011
View articletitled, Hot electron transmission in metals using epitaxial NiSi2/n-Si(111) interfaces
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Journal Articles

Room-temperature photoresponse of Schottky photodiodes based on GaN x As 1 − x synthesized by ion implantation and pulsed-laser melting

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Wei Yi, Taeseok Kim, Ilan Shalish, Marko Loncar, Michael J. Aziz, Venkatesh Narayanamurti
Journal: Applied Physics Letters
Appl. Phys. Lett. 97, 151103 (2010)
https://doi.org/10.1063/1.3500981
Published: October 2010
View articletitled, Room-temperature photoresponse of Schottky photodiodes based on GaN x As 1 − x synthesized by ion implantation and pulsed-laser melting
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Journal Articles

Ambipolar ballistic electron emission microscopy studies of gate-field modified Schottky barriers

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Y. L. Che, J. P. Pelz
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 242106 (2010)
https://doi.org/10.1063/1.3453866
Published: June 2010
View articletitled, Ambipolar ballistic electron emission microscopy studies of gate-field modified Schottky barriers
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Journal Articles

Measurement of the hot electron attenuation length of copper

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J. J. Garramone, J. R. Abel, I. L. Sitnitsky, L. Zhao, I. Appelbaum, V. P. LaBella
Journal: Applied Physics Letters
Appl. Phys. Lett. 96, 062105 (2010)
https://doi.org/10.1063/1.3299712
Published: February 2010
View articletitled, Measurement of the hot electron attenuation length of copper
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Journal Articles

Spatially resolved electronic properties of MgO/GaAs(001) tunnel barrier studied by ballistic electron emission microscopy

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S. Guézo, P. Turban, C. Lallaizon, J. C. Le Breton, P. Schieffer, B. Lépine, G. Jézéquel
Journal: Applied Physics Letters
Appl. Phys. Lett. 93, 172116 (2008)
https://doi.org/10.1063/1.3012571
Published: October 2008
View articletitled, Spatially resolved electronic properties of MgO/GaAs(001) tunnel barrier studied by ballistic electron emission microscopy
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Journal Articles

Two dimensionally patterned GaN x As 1 − x / GaAs nanostructures using N + implantation followed by pulsed laser melting

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Taeseok Kim, Michael J. Aziz, Venkatesh Narayanamurti
Journal: Applied Physics Letters
Appl. Phys. Lett. 93, 102117 (2008)
https://doi.org/10.1063/1.2982424
Published: September 2008
View articletitled, Two dimensionally patterned GaN x As 1 − x / GaAs nanostructures using N + implantation followed by pulsed laser melting
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Journal Articles

Studies on the Bi ∕ Si ( 100 ) − ( 2 × 1 ) interface

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A. Bannani, C. A. Bobisch, R. Möller
Journal: Applied Physics Letters
Appl. Phys. Lett. 93, 032111 (2008)
https://doi.org/10.1063/1.2963031
Published: July 2008
View articletitled, Studies on the Bi ∕ Si ( 100 ) − ( 2 × 1 ) interface
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Journal Articles

Study of InAs quantum dots in Al Ga As ∕ Ga As heterostructure by ballistic electron emission microscopy/spectroscopy

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J. Walachová, J. Zelinka, V. Malina, J. Vaniš, F. Šroubek, J. Pangrác, K. Melichar, E. Hulicius
Journal: Applied Physics Letters
Appl. Phys. Lett. 91, 042110 (2007)
https://doi.org/10.1063/1.2760134
Published: July 2007
View articletitled, Study of InAs quantum dots in Al Ga As ∕ Ga As heterostructure by ballistic electron emission microscopy/spectroscopy
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Journal Articles

Conduction band energies and hot-electron transport characteristics of epitaxial Sc 2 O 3 ∕ Si (111) studied by ballistic electron emission microscopy and internal photoemission

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W. Cai, S. E. Stone, J. P. Pelz, L. F. Edge, D. G. Schlom
Journal: Applied Physics Letters
Appl. Phys. Lett. 91, 042901 (2007)
https://doi.org/10.1063/1.2757150
Published: July 2007
View articletitled, Conduction band energies and hot-electron transport characteristics of epitaxial Sc 2 O 3 ∕ Si (111) studied by ballistic electron emission microscopy and internal photoemission
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Journal Articles

Ballistic electron transport through titanylphthalocyanine films

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S. Özcan, J. Smoliner, M. Andrews, G. Strasser, T. Dienel, R. Franke, T. Fritz
Journal: Applied Physics Letters
Appl. Phys. Lett. 90, 092107 (2007)
https://doi.org/10.1063/1.2710211
Published: February 2007
View articletitled, Ballistic electron transport through titanylphthalocyanine films
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Journal Articles

Conductive atomic force microscopy studies of thin Si O 2 layer degradation

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Patrick Fiorenza, Wouter Polspoel, Wilfried Vandervorst
Journal: Applied Physics Letters
Appl. Phys. Lett. 88, 222104 (2006)
https://doi.org/10.1063/1.2208370
Published: May 2006
View articletitled, Conductive atomic force microscopy studies of thin Si O 2 layer degradation
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Journal Articles

Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts

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C. Tivarus, J. P. Pelz, M. K. Hudait, S. A. Ringel
Journal: Applied Physics Letters
Appl. Phys. Lett. 87, 182105 (2005)
https://doi.org/10.1063/1.2120899
Published: October 2005
View articletitled, Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts
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Journal Articles

Nanoscale mapping of the space charge layer of Au ∕ Ga As ( 110 ) contacts

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T. C. G. Reusch, M. Wenderoth, L. Winking, N. Quaas, R. G. Ulbrich
Journal: Applied Physics Letters
Appl. Phys. Lett. 87, 093103 (2005)
https://doi.org/10.1063/1.2034097
Published: August 2005
View articletitled, Nanoscale mapping of the space charge layer of Au ∕ Ga As ( 110 ) contacts
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Journal Articles

Tunneling spectroscopy studies of treated aluminum oxide tunnel barrier layers

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P. G. Mather, A. C. Perrella, E. Tan, J. C. Read, R. A. Buhrman
Journal: Applied Physics Letters
Appl. Phys. Lett. 86, 242504 (2005)
https://doi.org/10.1063/1.1948532
Published: June 2005
View articletitled, Tunneling spectroscopy studies of treated aluminum oxide tunnel barrier layers
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Journal Articles

Cross-sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures

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D. Rakoczy, G. Strasser, J. Smoliner
Journal: Applied Physics Letters
Appl. Phys. Lett. 86, 202112 (2005)
https://doi.org/10.1063/1.1924882
Published: May 2005
View articletitled, Cross-sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures
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Journal Articles

Ballistic emission spectroscopy and imaging of a buried metal∕organic interface

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Cedric Troadec, Linda Kunardi, N. Chandrasekhar
Journal: Applied Physics Letters
Appl. Phys. Lett. 86, 072101 (2005)
https://doi.org/10.1063/1.1862789
Published: February 2005
View articletitled, Ballistic emission spectroscopy and imaging of a buried metal∕organic interface
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Journal Articles

Ballistic electron emission microscopy on spin valve structures

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R. Heer, J. Smoliner, J. Bornemeier, H. Brückl
Journal: Applied Physics Letters
Appl. Phys. Lett. 85, 4388–4390 (2004)
https://doi.org/10.1063/1.1814423
Published: November 2004
View articletitled, Ballistic electron emission microscopy on spin valve structures
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Journal Articles

Scanning tunneling microscope study of capped quantum dots

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H. Z. Song, M. Kawabe, Y. Okada, R. Yoshizaki, T. Usuki, Y. Nakata, T. Ohshima, N. Yokoyama
Journal: Applied Physics Letters
Appl. Phys. Lett. 85, 2355–2357 (2004)
https://doi.org/10.1063/1.1791340
Published: September 2004
View articletitled, Scanning tunneling microscope study of capped quantum dots
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Journal Articles

Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy

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E. R. Heller, J. P. Pelz
Journal: Applied Physics Letters
Appl. Phys. Lett. 82, 3919–3921 (2003)
https://doi.org/10.1063/1.1579844
Published: June 2003
View articletitled, Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy
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