1-20 of 66
Calibration methods
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

One-grating common-path phase-shifting interferometer for quantitative phase imaging

Youwei Deng, Weinan Huang, Binglin Shen, Jiaqing Guo, Rui Hu, Junle Qu, Yueshu Feng, Liwei Liu
Journal: Applied Physics Letters
Appl. Phys. Lett. 125, 153702 (2024)
https://doi.org/10.1063/5.0233937
Published: October 2024
View article titled, One-grating common-path phase-shifting interferometer for quantitative phase imaging
Open the PDF for One-grating common-path phase-shifting interferometer for quantitative phase imaging in another window
Journal Articles

In-operando microwave scattering-parameter calibrated measurement of a Josephson traveling wave parametric amplifier

Editor’s Pick
S.-H. Shin, M. Stanley, W. N. Wong, T. Sweetnam, A. Elarabi, T. Lindström, N. M. Ridler, S. E. de Graaf
Journal: Applied Physics Letters
Appl. Phys. Lett. 125, 104001 (2024)
https://doi.org/10.1063/5.0220776
Published: September 2024
View article titled, In-operando microwave scattering-parameter calibrated measurement of a Josephson traveling wave parametric amplifier
Open the PDF for In-operando microwave scattering-parameter calibrated measurement of a Josephson traveling wave parametric amplifier in another window
Journal Articles

Sensitivity and heat penalty in all-optical quantum thermometry with Germanium-vacancy color centers in diamond

Editor’s Pick
A. Dharmasiri, C. Vincent, T. I. Rajib, M. Pochechuev, X. Liu, A. J. Verhoef, G. S. Agarwal, A. M. Zheltikov
Journal: Applied Physics Letters
Appl. Phys. Lett. 125, 091102 (2024)
https://doi.org/10.1063/5.0207531
Published: August 2024
View article titled, Sensitivity and heat penalty in all-optical quantum thermometry with Germanium-vacancy color centers in diamond
Open the PDF for Sensitivity and heat penalty in all-optical quantum thermometry with Germanium-vacancy color centers in diamond in another window
Journal Articles

On the use of submerged piezoelectric MFCs for dual viscosity sensing and energy harvesting

Basil Alattar, Mehdi Ghommem, Rana Sabouni, Abdessattar Abdelkefi
Journal: Applied Physics Letters
Appl. Phys. Lett. 124, 243901 (2024)
https://doi.org/10.1063/5.0207764
Published: June 2024
View article titled, On the use of submerged piezoelectric MFCs for dual viscosity sensing and energy harvesting
Open the PDF for On the use of submerged piezoelectric MFCs for dual viscosity sensing and energy harvesting in another window
Journal Articles

Measurement of hydrogen release of cultural heritage materials during ion beam analysis using laser-induced breakdown spectroscopy of gas enhanced by solid initiator (GENS-LIBS)

Xueshi Bai, Thomas Calligaro, Brice Moignard, Sarah Richiero, Vincent Detalle
Journal: Applied Physics Letters
Appl. Phys. Lett. 124, 061107 (2024)
https://doi.org/10.1063/5.0179543
Published: February 2024
View article titled, Measurement of hydrogen release of cultural heritage materials during ion beam analysis using laser-induced breakdown spectroscopy of gas enhanced by solid initiator (GENS-LIBS)
Open the PDF for Measurement of hydrogen release of cultural heritage materials during ion beam analysis using laser-induced breakdown spectroscopy of gas enhanced by solid initiator (GENS-LIBS) in another window
Journal Articles

Self-referencing photothermal digital holographic microscope for characterization of low-loss liquids

H. Cabrera, B. Abbasgholi-NA, A. Rahman, S. Utadiya, A. Anand, M. Dashtdar
Journal: Applied Physics Letters
Appl. Phys. Lett. 123, 041101 (2023)
https://doi.org/10.1063/5.0159926
Published: July 2023
View article titled, Self-referencing photothermal digital holographic microscope for characterization of low-loss liquids
Open the PDF for Self-referencing photothermal digital holographic microscope for characterization of low-loss liquids in another window
Includes: Supplementary data
Journal Articles

Time-walk and jitter correction in SNSPDs at high count rates

FeaturedScilight
Andrew Mueller, Emma E. Wollman, Boris Korzh, Andrew D. Beyer, Lautaro Narvaez, Ryan Rogalin, Maria Spiropulu, Matthew D. Shaw
Journal: Applied Physics Letters
Appl. Phys. Lett. 122, 044001 (2023)
https://doi.org/10.1063/5.0129147
Published: January 2023
View article titled, Time-walk and jitter correction in SNSPDs at high count rates
Open the PDF for Time-walk and jitter correction in SNSPDs at high count rates in another window
Includes: Supplementary data
Journal Articles

Medium vacuum feasible displacement calibration of an optically levitated Duffing nonlinear oscillator

Yuan Tian, Yu Zheng, Lyu-Hang Liu, Guang-Can Guo, Fang-Wen Sun
Journal: Applied Physics Letters
Appl. Phys. Lett. 120, 221103 (2022)
https://doi.org/10.1063/5.0090178
Published: June 2022
View article titled, Medium vacuum feasible displacement calibration of an optically levitated Duffing nonlinear oscillator
Open the PDF for Medium vacuum feasible displacement calibration of an optically levitated Duffing nonlinear oscillator in another window
Journal Articles

Microwave calibration of qubit drive line components at millikelvin temperatures

Slawomir Simbierowicz, Volodymyr Y. Monarkha, Suren Singh, Nizar Messaoudi, Philip Krantz, Russell E. Lake
Journal: Applied Physics Letters
Appl. Phys. Lett. 120, 054004 (2022)
https://doi.org/10.1063/5.0081861
Published: February 2022
View article titled, Microwave calibration of qubit drive line components at millikelvin temperatures
Open the PDF for Microwave calibration of qubit drive line components at millikelvin temperatures in another window
Includes: Supplementary data
Journal Articles

Two-dimensional lifetime-based kHz surface temperature measurement technique using phosphor thermometry

Tao Cai, Jeongmin Han, Mirae Kim, Kyung Chun Kim
Journal: Applied Physics Letters
Appl. Phys. Lett. 119, 244101 (2021)
https://doi.org/10.1063/5.0068203
Published: December 2021
View article titled, Two-dimensional lifetime-based kHz surface temperature measurement technique using phosphor thermometry
Open the PDF for Two-dimensional lifetime-based kHz surface temperature measurement technique using phosphor thermometry in another window
Includes: Supplementary data
Journal Articles

Impact of roughness on heat conduction involving nanocontacts

Eloïse Guen, Pierre-Olivier Chapuis, Nupinder Jeet Kaur, Petr Klapetek, Séverine Gomés
Journal: Applied Physics Letters
Appl. Phys. Lett. 119, 161602 (2021)
https://doi.org/10.1063/5.0064244
Published: October 2021
View article titled, Impact of roughness on heat conduction involving nanocontacts
Open the PDF for Impact of roughness on heat conduction involving nanocontacts in another window
Includes: Supplementary data
Journal Articles

A measurement method for responsivity of microwave kinetic inductance detector by changing power of readout microwaves

H. Kutsuma, M. Hattori, R. Koyano, S. Mima, S. Oguri, C. Otani, T. Taino, O. Tajima
Journal: Applied Physics Letters
Appl. Phys. Lett. 115, 032603 (2019)
https://doi.org/10.1063/1.5110692
Published: July 2019
View article titled, A measurement method for responsivity of microwave kinetic inductance detector by changing power of readout microwaves
Open the PDF for A measurement method for responsivity of microwave kinetic inductance detector by changing power of readout microwaves in another window
Journal Articles

Experimental observation of size-dependent behavior in surface energy of gold nanoparticles through atomic force microscope

Jiangwei Liu, Raffaello Papadakis, Hu Li
Journal: Applied Physics Letters
Appl. Phys. Lett. 113, 083108 (2018)
https://doi.org/10.1063/1.5046736
Published: August 2018
View article titled, Experimental observation of size-dependent behavior in surface energy of gold nanoparticles through atomic force microscope
Open the PDF for Experimental observation of size-dependent behavior in surface energy of gold nanoparticles through atomic force microscope in another window
Includes: Supplementary data
Journal Articles

Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy

K. Hirose, K. Tanahashi, H. Takato, Y. Cho
Journal: Applied Physics Letters
Appl. Phys. Lett. 111, 032101 (2017)
https://doi.org/10.1063/1.4994813
Published: July 2017
View article titled, Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy
Open the PDF for Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy in another window
Journal Articles

Enhanced information content for three-dimensional localization and tracking using the double-helix point spread function with variable-angle illumination epifluorescence microscopy

Dapeng Wang, Anurag Agrawal, Rafael Piestun, Daniel K. Schwartz
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 211107 (2017)
https://doi.org/10.1063/1.4984133
Published: May 2017
View article titled, Enhanced information content for three-dimensional localization and tracking using the double-helix point spread function with variable-angle illumination epifluorescence microscopy
Open the PDF for Enhanced information content for three-dimensional localization and tracking using the double-helix point spread function with variable-angle illumination epifluorescence microscopy in another window
Includes: Supplementary data
Journal Articles

Droplet evaporation with complexity of evaporation modes

In Gyu Hwang, Jin Young Kim, Byung Mook Weon
Journal: Applied Physics Letters
Appl. Phys. Lett. 110, 031602 (2017)
https://doi.org/10.1063/1.4974292
Published: January 2017
View article titled, Droplet evaporation with complexity of evaporation modes
Open the PDF for Droplet evaporation with complexity of evaporation modes in another window
Includes: Supplementary data
Journal Articles

Code-division-multiplexed readout of large arrays of TES microcalorimeters

K. M. Morgan, B. K. Alpert, D. A. Bennett, E. V. Denison, W. B. Doriese, J. W. Fowler, J. D. Gard, G. C. Hilton, K. D. Irwin, Y. I. Joe, G. C. O'Neil, C. D. Reintsema, D. R. Schmidt, J. N. Ullom, D. S. Swetz
Journal: Applied Physics Letters
Appl. Phys. Lett. 109, 112604 (2016)
https://doi.org/10.1063/1.4962636
Published: September 2016
View article titled, Code-division-multiplexed readout of large arrays of TES microcalorimeters
Open the PDF for Code-division-multiplexed readout of large arrays of TES microcalorimeters in another window
Includes: Supplementary data
Journal Articles

Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy

L. Wang, J. M. Chauveau, R. Brenier, V. Sallet, F. Jomard, C. Sartel, G. Brémond
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 132103 (2016)
https://doi.org/10.1063/1.4945100
Published: March 2016
View article titled, Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy
Open the PDF for Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy in another window
Journal Articles

Quantitative measurements of shear displacement using atomic force microscopy

Wenbo Wang, Ying Sun, Yonggang Zhao, Weida Wu
Journal: Applied Physics Letters
Appl. Phys. Lett. 108, 122901 (2016)
https://doi.org/10.1063/1.4944799
Published: March 2016
View article titled, Quantitative measurements of shear displacement using atomic force microscopy
Open the PDF for Quantitative measurements of shear displacement using atomic force microscopy in another window
Journal Articles

Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films

Alexandra Papadogianni, Mark E. White, James S. Speck, Zbigniew Galazka, Oliver Bierwagen
Journal: Applied Physics Letters
Appl. Phys. Lett. 107, 252105 (2015)
https://doi.org/10.1063/1.4938471
Published: December 2015
View article titled, Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO<sub>2</sub> films
Open the PDF for Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO<sub>2</sub> films in another window