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Journal Articles

Uncovering the three-dimensional structure of upconverting core–shell nanoparticles with multislice electron ptychography

Stephanie M. Ribet, Georgios Varnavides, Cassio C. S. Pedroso, Bruce E. Cohen, Peter Ercius, Mary C. Scott, Colin Ophus

Appl. Phys. Lett. 124, 240601 (2024)

https://doi.org/10.1063/5.0206814

Published: June 2024

View article titled, Uncovering the three-dimensional structure of upconverting core–shell nanoparticles with multislice electron ptychography

Journal Articles

Lorentz near-field electron ptychography

Shengbo You, Peng-Han Lu, Thomas Schachinger, András Kovács, Rafal E. Dunin-Borkowski, Andrew M. Maiden

Appl. Phys. Lett. 123, 192406 (2023)

https://doi.org/10.1063/5.0169788

Published: November 2023

View article titled, Lorentz near-field electron ptychography

Journal Articles

On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling

Frank Seiboth, Andreas Schropp, Mikhail Lyubomirskiy, Wenxin Wang, Andreas Jahn, Satishkumar Kulkarni, Thomas F. Keller, Christian G. Schroer

Appl. Phys. Lett. 122, 241105 (2023)

https://doi.org/10.1063/5.0153149

Published: June 2023

View article titled, On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling

Journal Articles

Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

C. Gao, C. Hofer, D. Jannis, A. Béché, J. Verbeeck, T. J. Pennycook

Appl. Phys. Lett. 121, 081906 (2022)

https://doi.org/10.1063/5.0101895

Published: August 2022

View article titled, Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

Includes: Supplementary data

Journal Articles

Achieving high spatial resolution in a large field-of-view using lensless x-ray imaging

Yi Jiang, Junjing Deng, Yudong Yao, Jeffrey A. Klug, Sheikh Mashrafi, Christian Roehrig, Curt Preissner, Fabricio S. Marin, Zhonghou Cai, Barry Lai, Stefan Vogt

Appl. Phys. Lett. 119, 124101 (2021)

https://doi.org/10.1063/5.0067197

Published: September 2021

View article titled, Achieving high spatial resolution in a large field-of-view using lensless x-ray imaging

Includes: Supplementary data

Journal Articles

Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Felix Wittwer, Mikhail Lyubomirskiy, Frieder Koch, Maik Kahnt, Martin Seyrich, Jan Garrevoet, Christian David, Christian G. Schroer

Appl. Phys. Lett. 118, 171102 (2021)

https://doi.org/10.1063/5.0045571

Published: April 2021

View article titled, Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Journal Articles

Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Thomas E. J. Moxham, David Laundy, Vishal Dhamgaye, Oliver J. L. Fox, Kawal Sawhney, Alexander M. Korsunsky

Appl. Phys. Lett. 118, 104104 (2021)

https://doi.org/10.1063/5.0041341

Published: March 2021

View article titled, Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Includes: Supplementary data

Journal Articles

A highly efficient nanofocusing system for soft x rays

Yoko Takeo, Hiroto Motoyama, Takenori Shimamura, Takashi Kimura, Takehiro Kume, Yusuke Matsuzawa, Takahiro Saito, Yoichi Imamura, Hiroaki Miyashita, Kentaro Hiraguri, Hirokazu Hashizume, Yasunori Senba, Hikaru Kishimoto, Haruhiko Ohashi, Hidekazu Mimura

Appl. Phys. Lett. 117, 151104 (2020)

https://doi.org/10.1063/5.0027118

Published: October 2020

View article titled, A highly efficient nanofocusing system for soft x rays

Includes: Supplementary data

Journal Articles

AI-enabled high-resolution scanning coherent diffraction imaging

Mathew J. Cherukara, Tao Zhou, Youssef Nashed, Pablo Enfedaque, Alex Hexemer, Ross J. Harder, Martin V. Holt

Appl. Phys. Lett. 117, 044103 (2020)

https://doi.org/10.1063/5.0013065

Published: July 2020

View article titled, AI-enabled high-resolution scanning coherent diffraction imaging

Includes: Supplementary data

Journal Articles

Soft x-ray nanobeam formed by an ellipsoidal mirror

Yoko Takeo, Akihiro Suzuki, Hiroto Motoyama, Yoshinori Takei, Takehiro Kume, Yusuke Matsuzawa, Yasunori Senba, Hikaru Kishimoto, Haruhiko Ohashi, Hidekazu Mimura

Appl. Phys. Lett. 116, 121102 (2020)

https://doi.org/10.1063/1.5144932

Published: March 2020

View article titled, Soft x-ray nanobeam formed by an ellipsoidal mirror

Includes: Supplementary data

Journal Articles

Phase reconstruction using fast binary 4D STEM data

C. M. O'Leary, C. S. Allen, C. Huang, J. S. Kim, E. Liberti, P. D. Nellist, A. I. Kirkland

Appl. Phys. Lett. 116, 124101 (2020)

https://doi.org/10.1063/1.5143213

Published: March 2020

View article titled, Phase reconstruction using fast binary 4D STEM data

Includes: Supplementary data

Journal Articles

Subsampled STEM-ptychography

Andrew Stevens, Hao Yang, Weituo Hao, Lewys Jones, Colin Ophus, Peter D. Nellist, Nigel D. Browning

Appl. Phys. Lett. 113, 033104 (2018)

https://doi.org/10.1063/1.5040496

Published: July 2018

View article titled, Subsampled STEM-ptychography

Journal Articles

Efficient correction of wavefront inhomogeneities in X-ray holographic nanotomography by random sample displacement

Maxime Hubert, Alexandra Pacureanu, Cyril Guilloud, Yang Yang, Julio C. da Silva, Jerome Laurencin, Florence Lefebvre-Joud, Peter Cloetens

Appl. Phys. Lett. 112, 203704 (2018)

https://doi.org/10.1063/1.5026462

Published: May 2018

View article titled, Efficient correction of wavefront inhomogeneities in X-ray holographic nanotomography by random sample displacement

Includes: Supplementary data

Journal Articles

Determination of the structural phase and octahedral rotation angle in halide perovskites

Roberto dos Reis, Hao Yang, Colin Ophus, Peter Ercius, Gregory Bizarri, Didier Perrodin, Tetiana Shalapska, Edith Bourret, Jim Ciston, Ulrich Dahmen

Appl. Phys. Lett. 112, 071901 (2018)

https://doi.org/10.1063/1.5017537

Published: February 2018

View article titled, Determination of the structural phase and octahedral rotation angle in halide perovskites

Includes: Supplementary data

Journal Articles

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Xiaojing Huang, Hanfei Yan, Mingyuan Ge, Hande Öztürk, Evgeny Nazaretski, Ian K. Robinson, Yong S. Chu

Appl. Phys. Lett. 111, 023103 (2017)

https://doi.org/10.1063/1.4993744

Published: July 2017

View article titled, Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Journal Articles

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Jens Patommel, Susanne Klare, Robert Hoppe, Stephan Ritter, Dirk Samberg, Felix Wittwer, Andreas Jahn, Karola Richter, Christian Wenzel, Johann W. Bartha, Maria Scholz, Frank Seiboth, Ulrike Boesenberg, Gerald Falkenberg, Christian G. Schroer

Appl. Phys. Lett. 110, 101103 (2017)

https://doi.org/10.1063/1.4977882

Published: March 2017

View article titled, Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Journal Articles

Near-edge X-ray refraction fine structure microscopy

Maryam Farmand, Richard Celestre, Peter Denes, A. L. David Kilcoyne, Stefano Marchesini, Howard Padmore, Tolek Tyliszczak, Tony Warwick, Xiaowen Shi, James Lee, Young-Sang Yu, Jordi Cabana, John Joseph, Harinarayan Krishnan, Talita Perciano, Filipe R. N. C. Maia, David A. Shapiro

Appl. Phys. Lett. 110, 063101 (2017)

https://doi.org/10.1063/1.4975377

Published: February 2017

View article titled, Near-edge X-ray refraction fine structure microscopy

Includes: Supplementary data

Journal Articles

Development and characterization of monolithic multilayer Laue lens nanofocusing optics

E. Nazaretski, W. Xu, N. Bouet, J. Zhou, H. Yan, X. Huang, Y. S. Chu

Appl. Phys. Lett. 108, 261102 (2016)

https://doi.org/10.1063/1.4955022

Published: June 2016

View article titled, Development and characterization of monolithic multilayer Laue lens nanofocusing optics

Journal Articles

Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo₅ films

X. Shi, P. Fischer, V. Neu, D. Elefant, J. C. T. Lee, D. A. Shapiro, M. Farmand, T. Tyliszczak, H.-W. Shiu, S. Marchesini, S. Roy, S. D. Kevan

Appl. Phys. Lett. 108, 094103 (2016)

https://doi.org/10.1063/1.4942776

Published: March 2016

View article titled, Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo<sub>5</sub> films

Journal Articles

Efficient use of coherent X-rays in ptychography: Towards high-resolution and high-throughput observation of weak-phase objects

Nicolas Burdet, Kei Shimomura, Makoto Hirose, Akihiro Suzuki, Yukio Takahashi

Appl. Phys. Lett. 108, 071103 (2016)

https://doi.org/10.1063/1.4942105

Published: February 2016

View article titled, Efficient use of coherent X-rays in ptychography: Towards high-resolution and high-throughput observation of weak-phase objects

NARROW

Topics

Uncovering the three-dimensional structure of upconverting core–shell nanoparticles with multislice electron ptychography

Lorentz near-field electron ptychography

On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling

Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

Achieving high spatial resolution in a large field-of-view using lensless x-ray imaging

Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

A highly efficient nanofocusing system for soft x rays

AI-enabled high-resolution scanning coherent diffraction imaging

Soft x-ray nanobeam formed by an ellipsoidal mirror

Phase reconstruction using fast binary 4D STEM data

Subsampled STEM-ptychography

Efficient correction of wavefront inhomogeneities in X-ray holographic nanotomography by random sample displacement

Determination of the structural phase and octahedral rotation angle in halide perovskites

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Near-edge X-ray refraction fine structure microscopy

Development and characterization of monolithic multilayer Laue lens nanofocusing optics

Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo₅ films

Efficient use of coherent X-rays in ptychography: Towards high-resolution and high-throughput observation of weak-phase objects

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