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Plasma Sources for Advanced Semiconductor Applications

Plasma sources are essential tools for advanced semiconductor and computation technologies. Laser-produced plasma powers state-of-the-art nanolithography by generating the required extreme-ultraviolet (EUV) light. Remarkable reduction of feature-sizes in modern semiconductors is a major theme for semiconductor manufacturing where features are approaching nanometers and often involve 3D structures. Predicting, modeling, and high-resolution measurements of plasma properties of advanced plasma sources are at the forefront of research for many advanced industrial applications. This Joint Special Topic Collection in Applied Physics Letters and Physics of Plasmas welcomes new submissions reporting new research results and perspectives in the field of plasma sources and their many important applications to semiconductor and computational technologies.

Read this collection’s papers published in Applied Physics Letters here and published in Physics of Plasmas here.

Guest Editors: Oscar Versolato, Ronnie Hoekstra, John Sheil, Igor Kaganovich, Thorsten Lill, Kallol Bera, Sang Ki Nam, and Hyo-Chang Lee

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Oscar Versolato; Igor Kaganovich; Kallol Bera; Thorsten Lill; Hyo-Chang Lee; Ronnie Hoekstra; John Sheil; Sang Ki Nam
Bocong Zheng; Yangyang Fu; Keliang Wang; Huihui Wang; Long Chen; Thomas Schuelke; Qi Hua Fan
S. R. Totorica; K. Lezhnin; D. J. Hemminga; J. Gonzalez; J. Sheil; A. Diallo; A. Hyder; W. Fox
Nozomi Tanaka; Baojun Zhu; Chang Liu; Yubo Wang; Katsunobu Nishihara; James Edward Hernandez; Tomoyuki Johzaki; Atsushi Sunahara; Kyung Sik Kang; Shinji Ueyama; Ken Ozawa; Shinsuke Fujioka
Bhavesh Ramkorun; Swapneal Jain; Adib Taba; Masoud Mahjouri-Samani; Michael E. Miller; Saikat C. Thakur; Edward Thomas, Jr.; Ryan B. Comes
Lakshman Srinivasan; Laurent Invernizzi; Swaminathan Prasanna; Kristaq Gazeli; Nicolas Fagnon; Pere Roca i Cabarrocas; Guillaume Lombardi; Karim Ouaras
K. Mongey; S. J. J. de Lange; R. Brady; D. J. Hemminga; B. Delaney; M. M. Basko; E. Sokell; F. O'Reilly; J. Sheil
Elia Jüngling; Sebastian Wilczek; Thomas Mussenbrock; Marc Böke; Achim von Keudell
A. Sasaki
Yang Zhou; Kai Zhao; Fang-Fang Ma; Yong-Xin Liu; Fei Gao; Julian Schulze; You-Nian Wang
Nirbhav Singh Chopra; Ivan Romadanov; Yevgeny Raitses
Takeru Niinuma; Tsukasa Sugiura; Hiroki Morita; Weihua Jiang; Kazuyuki Sakaue; Gerry O'Sullivan; Shinichi Namba; Takeshi Higashiguchi
Masaki Kume; Tsukasa Sugiura; Hiroki Morita; Weihua Jiang; Kazuyuki Sakaue; Shinichi Namba; Gerry O'Sullivan; Takeshi Higashiguchi
F. Sato; A. Nagano; Y. Teramoto
James Edward Hernandez; Nozomi Tanaka; Ryuya Yamada; Yubo Wang; Katsunobu Nishihara; Tomoyuki Johzaki; Atsushi Sunahara; Kyung Sik Kang; Shinji Ueyama; Ken Ozawa; Shinsuke Fujioka
De-Qi Wen; Janez Krek; Jon Tomas Gudmundsson; Emi Kawamura; Michael A Lieberman; Peng Zhang; John P Verboncoeur
D. J. Engels; R. A. Meijer; H. K. Schubert; W. J. van der Zande; W. Ubachs; O. O. Versolato
Sung Hyun Son; Geunwoo Go; Willca Villafana; Igor D Kaganovich; Alexander Khrabrov; Hyo-Chang Lee; Kyoung-Jae Chung; Gwang-Seok Chae; Seungbo Shim; Donghyeon Na; June Young Kim
Y. Mostafa; L. Behnke; D. J. Engels; Z. Bouza; J. Sheil; W. Ubachs; O. O. Versolato
Shih-Nan Hsiao; Makoto Sekine; Kenji Ishikawa; Yuki Iijima; Yoshinobu Ohya; Masaru Hori
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