Skip Nav Destination
Highly conductive Sb-doped layers in strained Si
Appl. Phys. Lett. 89, 182122 (2006)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
- Won-Chae Jung
Journal of the Korean Institute of Electrical and Electronic Material Engineers 28, 683 (2015)
- J. K. Lorenz
- E. Baer
- A. Burenkov
- A. Erdmann
- P. Evanschitzky
- P. Pichler
Journal of Computational Electronics 13, 3 (2014)
- H. Trinkaus
- D. Buca
- B. Holländer
- R. A. Minamisawa
- S. Mantl
- J. M. Hartmann
Journal of Applied Physics (2010) 107 (12)
- A.Yu. Azarov
- A. Zamani
- H.H. Radamson
- L. Vines
- A.Yu. Kuznetsov
- A. Hallén
Thin Solid Films 518, 2474 (2010)
- D. Buca
- W. Heiermann
- H. Trinkaus
- B. Holländer
- U. Breuer
- S. Mantl
Solid-State Electronics 53, 828 (2009)
- Chihak Ahn
- Nick Bennett
- Scott T. Dunham
- Nick E. B. Cowern
Physical Review B (2009) 79 (7)
- Beat Sahli
- Kilian Vollenweider
- Wolfgang Fichtner
Physical Review B (2009) 80 (7)
- Y. Lai
- N.S. Bennett
- C. Ahn
- N.E.B. Cowern
- N. Cordero
- J.C. Greer
Solid-State Electronics 53, 1173 (2009)
- Nicholas S. Bennett
- Chihak Ahn
- Nicholas E.B. Cowern
- Peter Pichler
Solid State Phenomena (2009) 156-158: 173.
- Yan Lai
- Nicolas Cordero
- James C Greer
MRS Proceedings (2008) 1070
- K. Horan
- A. Lankinen
- L. O’Reilly
- N.S. Bennett
- P.J. McNally
- B.J. Sealy
- N.E.B. Cowern
- T.O. Tuomi
Materials Science and Engineering: B (2008) 154-155: 118.
- N.S. Bennett
- H.H. Radamson
- C.S. Beer
- A.J. Smith
- R.M. Gwilliam
- N.E.B. Cowern
- B.J. Sealy
Thin Solid Films 517, 331 (2008)
- N. S. Bennett
- A. J. Smith
- R. M. Gwilliam
- R. P. Webb
- B. J. Sealy
- N. E. B. Cowern
- L. O’Reilly
- P. J. McNally
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 26, 391 (2008)
- L. O’Reilly
- K. Horan
- P. J. McNally
- N. S. Bennett
- N. E. B. Cowern
- A. Lankinen
- B. J. Sealy
- R. M. Gwilliam
- T. C. Q. Noakes
- P. Bailey
Applied Physics Letters (2008) 92 (23)
- L. O’Reilly
- N. S. Bennett
- P. J. McNally
- B. J. Sealy
- N. E. B. Cowern
- A. Lankinen
- T. O. Tuomi
Journal of Materials Science: Materials in Electronics 19, 305 (2008)
- A. Höglund
- O. Eriksson
- C. W. M Castleton
- S. Mirbt
Physical Review Letters (2008) 100 (10)
- N.S. Bennett
- N.E.B. Cowern
- A.J. Smith
- M. Kah
- R.M. Gwilliam
- B.J. Sealy
- T.C.Q. Noakes
- P. Bailey
- D. Giubertoni
- M. Bersani
Materials Science and Engineering: B (2008) 154-155: 229.