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Subattoampere current induced by single ions in silicon oxide layers of nonvolatile memory cells

Appl. Phys. Lett. 88, 192909 (2006)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 27, 406 (2009)
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IEEE Transactions on Nuclear Science 54, 2371 (2007)
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