Skip to Main Content
Skip Nav Destination

Model for facet and sidewall defect formation during selective epitaxial growth of (001) silicon

Appl. Phys. Lett. 52, 546–548 (1988)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Jungsik Kim
  • Jin-Woo Han
  • M. Meyyappan
IEEE Transactions on Electron Devices 67, 4765 (2020)
  • J.W. Jhang
  • G. Regula
  • G. Reinhart
  • N. Mangelinck-Noël
  • C.W. Lan
Journal of Crystal Growth (2019) 508: 42.
  • Min-Hao Hong
  • Dung-Ching Perng
Journal of Theoretical and Applied Physics 11, 313 (2017)
  • V. Sinha
  • S. K. Jha
  • A. L. Pilchak
  • W. J. Porter
  • R. John
  • J. M. Larsen
Metallography, Microstructure, and Analysis 6, 261 (2017)
  • Keun Wook Shin
  • Sung Hyun Park
  • Yongjo Park
  • Euijoon Yoon
ECS Journal of Solid State Science and Technology 4, P83 (2015)
  • G.S. Ganot
  • P.C. van der Wilt
  • H.K. Effron
  • B.A. Turk
  • U.J. Chung
  • A.M. Chitu
  • A.B. Limanov
  • James S. Im
MRS Proceedings (2012) 1426: 389.
  • Clément Pribat
  • Didier Dutartre
Journal of Crystal Growth 334, 138 (2011)
  • A. Fox
  • B. Heinemann
  • H. Rücker
Solid-State Electronics 60, 93 (2011)
  • Seung Ryul Lee
  • Kyung Min Ahn
  • Seung Mo Kang
  • Byung Tae Ahn
Solar Energy Materials and Solar Cells 94, 606 (2010)
  • Clément Pribat
  • Germain Servanton
  • Linda Depoyan
  • Didier Dutartre
Solid-State Electronics 53, 865 (2009)
  • S.C. Rustagi
  • J. Wang
  • Y.Z. Xiong
  • G.Q. Lo
  • D.L. Kwong
IEEE Electron Device Letters 30, 934 (2009)
  • Ji-Soo Park
  • Jie Bai
  • Michael Curtin
  • Mark Carroll
  • Anthony Lochtefeld
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 26, 117 (2008)
  • Seung-Hyun Lim
  • Sukchan Song
  • Gun-Do Lee
  • Euijoon Yoon
  • Jong-Ho Lee
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 22, 682 (2004)
  • Seung-Hyun Lim
  • Sukchan Song
  • Euijoon Yoon
  • Jong-Ho Lee
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 22, 275 (2004)
  • Woo-Seok Cheong
  • Seok-Kiu Lee
  • Jae-Sung Roh
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 21, 975 (2003)
  • R. Loo
  • M. Caymax
  • I. Peytier
  • S. Decoutere
  • N. Collaert
  • P. Verheyen
  • W. Vandervorst
  • K. De Meyer
Journal of The Electrochemical Society 150, G638 (2003)
  • Takumi Nakahata
  • Kohei Sugihara
  • Taisuke Furukawa
  • Satoshi Yamakawa
  • Shigemitsu Maruno
  • Yasunori Tokuda
  • Kazuma Yamamoto
  • Toru Inagaki
  • Hiromi Kiyama
Materials Science and Engineering: B 68, 171 (2000)
  • Katherine E. Violette
  • Rick Wise
  • Chih-Ping Chao
  • Sreenath Unnikrishnan
MRS Proceedings (1998) 525
  • L. Vescan
  • K. Grimm
  • C. Dieker
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 16, 1549 (1998)
  • H.-C. Tseng
  • C. Y. Chang
  • F. M. Pan
  • J. R. Chen
  • L. J. Chen
Applied Physics Letters 71, 2328 (1997)
  • Shaozhong Li
  • Qi Xiang
  • Dawen Wang
  • Kang L. Wang
Journal of Crystal Growth 164, 235 (1996)
  • K. Werner
  • A. Storm
  • S. Butzke
  • J.W. Maes
  • M. van Rooy
  • P. Alkemade
  • E. Algra
  • M. Somers
  • B. de Lange
  • E. van der Drift
  • T. Zijlstra
  • S. Radelaar
Journal of Crystal Growth 164, 223 (1996)
  • J.L. Regolini
  • J. Margail
  • S. Bodnar
  • D. Maury
  • C. Morin
Applied Surface Science (1996) 100-101: 566.
  • G. Schmidt
  • R. Tuzinski
  • K. Heime
  • U. Richter
Physica Status Solidi (a) 151, 165 (1995)
  • H. L. Hsiao
  • K. C. Wang
  • L. W. Cheng
  • A. B. Yang
  • T. R. Yew
  • H. L. Hwang
MRS Proceedings (1995) 406
  • Srikanth B. Samavedam
  • Eric P. Kvam
  • Abul E. Kabir
  • Gerold W. Neudeck
Journal of Electronic Materials 24, 1747 (1995)
  • S. Mohajerzadeh
  • C. R. Selvakumar
  • D. E. Brodie
  • M. D. Robertson
  • J. M. Corbett
Journal of Applied Physics 78, 2057 (1995)
  • Kun-Chih Wang
  • Ruo-Yu Wang
  • Tri-Rung Yew
  • Joseph J. Loferski
  • Huey-Liang Hwang
MRS Proceedings (1995) 377
  • L. Vescan
  • C. Dieker
  • R. Loo
  • R. Apetz
  • A. Hartmann
  • S. Wickenhäuser
  • H. Lüth
Materials Science and Technology 11, 421 (1995)
  • J. M. Bonar
  • G. J. Parker
Materials Science and Technology 11, 31 (1995)
  • Y. C. Shih
  • J. B. Liu
  • W. G. Oldham
  • R. Gronsky
Applied Physics Letters 65, 1142 (1994)
  • G. Schmidt
  • W. Langheinrich
  • K. Heime
Solid-State Electronics 37, 587 (1994)
  • Yang-Chin Shih
  • Jen-Chung Lou
  • William G. Oldham
Applied Physics Letters 65, 1638 (1994)
  • Tohru Aoyama
  • Taeko Ikarashi
  • Keiko Miyanaga
  • Toru Tatsumi
Journal of Crystal Growth 136, 349 (1994)
  • C.T. Nguyen
  • S.C. Kuehne
  • S.S. Wong
  • L.K. Garling
  • C. Drowley
IEEE Transactions on Electron Devices 41, 2343 (1994)
  • H. Yen
  • E. P. Kvam
  • R. Bashir
  • G. W. Neudeck
Journal of Electronic Materials 22, 1331 (1993)
  • Yangchin Shih
  • J. C. Lou
  • W. G. Oldham
MRS Proceedings (1993) 317
  • M.R. Goulding
Materials Science and Engineering: B 17, 47 (1993)
  • Haw Yen
  • Rashid Bashir
  • Eric P. Kvam
  • Gerold W. Neudeck
MRS Proceedings (1993) 319
  • M.C. Arst
  • K.N. Ritz
  • S. Redkar
  • J.O. Borland
  • J. Hann
  • J.T. Chen
Journal of Materials Research 6, 784 (1991)
  • J.G.E. Gardeniers
  • C.H. Klein Douwel
  • L.J. Giling
Journal of Crystal Growth 108, 319 (1991)
  • J.W. Osenbach
  • D.G. Schimmel
  • A. Feygenson
  • J.J. Bastek
  • J.C.C. Tsai
  • H.C. Praefcke
  • E.W. Bonato
Journal of Materials Research 6, 2318 (1991)
  • F. Banhart
  • R. Bergmann
  • F. Phillipp
  • E. Bauser
Applied Physics A Solids and Surfaces 53, 317 (1991)
  • E. A. Fitzgerald
  • Naresh Chand
Journal of Electronic Materials 20, 839 (1991)
  • P. D. Agnello
  • T. O. Sedgwick
  • M. S. Goorsky
  • J. Ott
  • T. S. Kuan
  • G. Scilla
Applied Physics Letters 59, 1479 (1991)

or Create an Account

Close Modal
Close Modal