Skip to Main Content
Close
Publishers
AIP Publishing
Physics Today
Acoustical Society of America
American Association of Physics Teachers
American Crystallographic Association, Inc.
AVS: Science and Technology of Materials, Interfaces and Processing
Chinese Physical Society
Hefei General Machinery Research Institute
Laser Institute of America
The Society of Rheology
Tianjin University
Publications
Journals
Physics Today
AIP Conference Proceedings
Books
Special Topics
Authors
Librarians
About
Search Dropdown Menu
header search
search input
Search input auto suggest
filter your search
All Content
AIP Publishing Portfolio
Applied Physics Letters
Search
Advanced Search
|
Citation Search
User Tools Dropdown
Sign In
Toggle Menu
Menu
Home
Browse
Newest Issue
All Issues
Collections
Editor's Picks
Fast Track
Featured
Perspectives
Press Releases
Roadmaps
Scilights
Special Topics
Upcoming Special Topics
Publish With Us
Submit Your Manuscript
Preparing Your Manuscript
Journal Specific Guidelines
Publication Charges
Author Resources
AIP Author Services
About
Overview
Editorial Policies
Rising Stars Collection
Contact
Editorial Board
Editorial Board Historical Data
Editorial Advisory Board
Journal Development Team
News
Skip Nav Destination
Depth profiling of ZnO thin films by cathodoluminescence
Appl. Phys. Lett.
78, 2667–2669 (2001)
Currently there are no citedby results. Try again later.
Close Modal
Close Modal
This Feature Is Available To Subscribers Only
Sign In
or
Create an Account
Close Modal
Close Modal
