Uniaxial dielectric anisotropy in Ba0.5Sr0.5TiO3 films studied by evanescent-probe microscopy

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Uniaxial dielectric anisotropy in ${Ba}_{0.5} {Sr}_{0.5} {TiO}_{3}$ films studied by evanescent-probe microscopy

Appl. Phys. Lett. 78, 3872–3874 (2001)

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Uniaxial dielectric anisotropy in ${Ba}_{0.5} {Sr}_{0.5} {TiO}_{3}$ films studied by evanescent-probe microscopy

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Uniaxial dielectric anisotropy in ${Ba}_{0.5} {Sr}_{0.5} {TiO}_{3}$ films studied by evanescent-probe microscopy