Skip Nav Destination
Quantification of substitutional carbon loss from due to silicon self-interstitial injection during oxidation
Appl. Phys. Lett. 81, 1225–1227 (2002)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
- Shenzhong Li
- Tong Zhao
- Defan Wu
- Xingbo Liang
- Hao Chen
- Qunlin Nie
- Daxi Tian
- Xiangyang Ma
- Deren Yang
Journal of Applied Physics (2024) 135 (23)
- S Ahmed
- R Mustafa
IOP Conference Series: Materials Science and Engineering (2013) 51: 012004.
- Masashi Uematsu
Journal of Applied Physics (2012) 111 (7)
- E. Quek
IEEE Electron Device Letters 27, 442 (2006)
- Chung Foong Tan
- Eng Fong Chor
- Hyeokjae Lee
- Jinping Liu
- Elgin Quek
- Lap Chan
Thin Solid Films 504, 132 (2006)
- E. -S. Oh
- J. R. Walton
- D. C. Lagoudas
- J. C. Slattery
Acta Mechanica 181, 231 (2006)
- E. J. Stewart
- M. S. Carroll
- J. C. Sturm
Journal of The Electrochemical Society 152, G500 (2005)
- E. Quek
IEEE Electron Device Letters 26, 252 (2005)
- M.-J. Tsai
- T.F. Lei
IEEE Electron Device Letters 26, 740 (2005)
- Arturo Sibaja-Hernandez
- Ming Wei Xu
- Stefaan Decoutere
- Herman Maes
Materials Science in Semiconductor Processing 8, 115 (2005)
- E. J. Stewart
- M. S. Carroll
- J. C. Sturm
Journal of Applied Physics 95, 4029 (2004)
- W. Feng
- W. K. Choi
Journal of Applied Physics 95, 4197 (2004)
- E.J Stewart
- J.C Sturm
Applied Surface Science 224, 87 (2004)
- E. J. Stewart
- J.C. Sturm
MRS Proceedings (2003) 765
- Chung Foong Tan
- Eng Fong Chor
- Jinping Liu
- Hyeokjae Lee
- Elgin Quek
- Lap Chan
Applied Physics Letters 83, 4169 (2003)