Skip to Main Content
Skip Nav Destination

Electrical characterization of the soft breakdown failure mode in MgO layers

Appl. Phys. Lett. 95, 012901 (2009)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Changhyuk Kim
  • Peter V. Pikhitsa
  • Sukbyung Chae
  • Kyungil Cho
  • Mansoo Choi
AIP Advances (2019) 9 (12)
  • Raid A Ismail
  • Khawla S Khashan
  • Muslim F Jawad
  • Ali M Mousa
  • Farah Mahdi
Materials Research Express 5, 055018 (2018)
  • Catarina Dias
  • Luís. M. Guerra
  • Bernardo D. Bordalo
  • Hua Lv
  • Ana M. Ferraria
  • Ana M. Botelho do Rego
  • Susana Cardoso
  • Paulo P. Freitas
  • João Ventura
Physical Chemistry Chemical Physics 19, 10898 (2017)
  • Yoshiaki Hattori
  • Takashi Taniguchi
  • Kenji Watanabe
  • Kosuke Nagashio
ACS Applied Materials & Interfaces 8, 27877 (2016)
  • Hsin-Hung Huang
  • Wen-Chieh Shih
  • Chih-Huang Lai
Applied Physics Letters (2010) 96 (19)
  • V. V. Afanas’ev
  • A. Stesmans
  • K. Cherkaoui
  • P. K. Hurley
Applied Physics Letters (2010) 96 (5)
Close Modal

or Create an Account

Close Modal
Close Modal