Skip to Main Content
Skip Nav Destination

Electronic band structure of the buried SiO2/SiC interface investigated by soft x-ray ARPES

Appl. Phys. Lett. 110, 132101 (2017)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Yang Wang
  • Maciej Dendzik
Measurement Science and Technology 35, 042002 (2024)
  • Masafumi Horio
  • Filomena Forte
  • Denys Sutter
  • Minjae Kim
  • Claudia G. Fatuzzo
  • Christian E. Matt
  • Simon Moser
  • Tetsuya Wada
  • Veronica Granata
  • Rosalba Fittipaldi
  • Yasmine Sassa
  • Gianmarco Gatti
  • Henrik M. Rønnow
  • Moritz Hoesch
  • Timur K. Kim
  • Chris Jozwiak
  • Aaron Bostwick
  • Eli Rotenberg
  • Iwao Matsuda
  • Antoine Georges
  • Giorgio Sangiovanni
  • Antonio Vecchione
  • Mario Cuoco
  • Johan Chang
Communications Physics (2023) 6 (1)
  • Hui-Qiong Wang
  • Jiayi Xu
  • Xiaoyuan Lin
  • Yaping Li
  • Junyong Kang
  • Jin-Cheng Zheng
Light: Science & Applications (2021) 10 (1)
  • Judith Berens
  • Sebastian Bichelmaier
  • Nathalie K Fernando
  • Pardeep K Thakur
  • Tien-Lin Lee
  • Manfred Mascheck
  • Tomas Wiell
  • Susanna K Eriksson
  • J Matthias Kahk
  • Johannes Lischner
  • Manesh V Mistry
  • Thomas Aichinger
  • Gregor Pobegen
  • Anna Regoutz
Journal of Physics: Energy 2, 035001 (2020)
  • V.N. Strocov
  • L.L. Lev
  • M. Kobayashi
  • C. Cancellieri
  • M.-A. Husanu
  • A. Chikina
  • N.B.M. Schröter
  • X. Wang
  • J.A. Krieger
  • Z. Salman
Journal of Electron Spectroscopy and Related Phenomena (2019) 236: 1.
  • Anna Regoutz
  • Gregor Pobegen
  • Thomas Aichinger
Journal of Materials Chemistry C 6, 12079 (2018)
  • V.N. Strocov
Journal of Electron Spectroscopy and Related Phenomena (2018) 229: 100.
Close Modal

or Create an Account

Close Modal
Close Modal