Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope

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Appl. Phys. Lett. 102, 083109 (2013)

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Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope

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Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope

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