Skip to Main Content
Skip Nav Destination

The physical origin of random telegraph noise after dielectric breakdown

Appl. Phys. Lett. 94, 132904 (2009)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Alok Ranjan
  • Francesco Maria Puglisi
  • Joel Molina-Reyes
  • Paolo Pavan
  • Sean J. O’Shea
  • Nagarajan Raghavan
  • Kin Leong Pey
ACS Applied Electronic Materials 4, 3909 (2022)
  • Atta Ur Rahman
  • Muhammad Javed
  • ZhaoXu Ji
  • Arif Ullah
Journal of Physics A: Mathematical and Theoretical 55, 025305 (2022)
  • Xiao Xiong
  • Yang Zhou
  • Yi Luo
  • Xiang Li
  • Michel Bosman
  • Lay Kee Ang
  • Peng Zhang
  • Lin Wu
ACS Nano 14, 8806 (2020)
  • Fei Hui
  • Chengbin Pan
  • Yuanyuan Shi
  • Yanfeng Ji
  • Enric Grustan-Gutierrez
  • Mario Lanza
Microelectronic Engineering (2016) 163: 119.
  • Nagarajan Raghavan
  • Daniel D. Frey
  • Kin Leong Pey
Microelectronics Reliability 54, 1729 (2014)
  • Nagarajan Raghavan
  • Kin Leong Pey
  • Kalya Shubhakar
Microelectronics Reliability 54, 847 (2014)
  • Nagarajan Raghavan
  • Andrea Padovani
  • Xiang Li
  • Xing Wu
  • Vui Lip Lo
  • Michel Bosman
  • Luca Larcher
  • Kin Leong Pey
Journal of Applied Physics (2013) 114 (9)
  • Xing Wu
  • Dongkyu Cha
  • Michel Bosman
  • Nagarajan Raghavan
  • Dmitri B. Migas
  • Victor E. Borisenko
  • Xi-Xiang Zhang
  • Kun Li
  • Kin-Leong Pey
Journal of Applied Physics (2013) 113 (11)
  • W. H. Liu
  • K. L. Pey
  • X. Wu
  • N. Raghavan
  • A. Padovani
  • L. Larcher
  • L. Vandelli
  • M. Bosman
  • T. Kauerauf
Applied Physics Letters (2011) 99 (23)
  • Xing Wu
  • Kin-Leong Pey
  • Nagarajan Raghavan
  • Wen-Hu Liu
  • Xiang Li
  • Ping Bai
  • Gang Zhang
  • Michel Bosman
Nanotechnology 22, 455702 (2011)
  • Nagarajan Raghavan
  • Kin Leong Pey
  • Wenhu Liu
  • Xing Wu
  • Xiang Li
  • Michel Bosman
Microelectronic Engineering 88, 1124 (2011)
  • Y. N. Chen
  • K. L. Pey
  • K. E. J. Goh
  • Z. Z. Lwin
  • P. Singh
  • S. Mahapatra
Applied Physics Letters (2011) 98 (8)
  • Y. N. Chen
  • K. L. Pey
  • K. E. J. Goh
  • Z. Z. Lwin
  • P. K. Singh
  • S. Mahapatra
IEEE Transactions on Electron Devices 57, 3001 (2010)
  • P. Gonon
  • M. Mougenot
  • C. Vallée
  • C. Jorel
  • V. Jousseaume
  • H. Grampeix
  • F. El Kamel
Journal of Applied Physics (2010) 107 (7)
  • Xin Luo
  • Biao Wang
  • Yue Zheng
Journal of Applied Physics (2009) 106 (7)
Close Modal

or Create an Account

Close Modal
Close Modal