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Local charge trapping and detection of trapped charge by scanning capacitance microscope in the /Si system
Appl. Phys. Lett. 75, 1760–1762 (1999)
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- Shinichi Saito
- C H (Kees) de Groot
- Yoshishige Tsuchiya
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- C. Li
- H. M. Li
- Z. J. Ding
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- Sangsoo Oh
- Hosup Kim
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- Georges Bremond
- Franck Bassani
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- Shingo Kuge
- Haruhiko Yoshida
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- M. Porti
- M. Avidano
- M. Nafría
- X. Aymerich
- J. Carreras
- O. Jambois
- B. Garrido
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- M. Porti
- S. Gerardin
- M. NafrÍa
- X. Aymerich
- A. Cester
- A. Paccagnella
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- M. Porti
- S. Gerardin
- M. Nafrı´a
- X. Aymerich
- A. Cester
- A. Paccagnella
- P. Schiavuta
- R. Pierobon
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- Young Jin Choi
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- Y. Khang
- Eun Hye Lee
- Yong Sang Kim
- Y.J. Choi
- C.J. Kang
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- Fan-Yi Hsu
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- J. M. Son
- J. M. Kim
- Y. Khang
- E. H. Lee
- S. I. Park
- Y. S. Kim
- C. J. Kang
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- S. D. Wang
- M. N. Chang
- C. Y. Chen
- T. F. Lei
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- M. Avidano
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- D Jeon
- Y Kuk
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- F. M. Pan
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- M. Nafrı́a
- M. C. Blüm
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- M. N. Chang
- T. Y. Chang
- F. M. Pan
- B. W. Wu
- T. F. Lei
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- U. H. Pi
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