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INVITED ARTICLES

Rev. Sci. Instrum. 95, 111301 (2024) https://doi.org/10.1063/5.0202702

ARTICLES

Equipment and Techniques for Lasers, Lasers, Pump-Probe and Resonance Ionization Lasers
Rev. Sci. Instrum. 95, 113001 (2024) https://doi.org/10.1063/5.0229024
Atom/Molecule Traps, Equipment and Techniques for traps; Zeeman slowers, magnets for traps, Manipulation and Detection
Rev. Sci. Instrum. 95, 113201 (2024) https://doi.org/10.1063/5.0223352
Equipment and Techniques for Ion Optics and Acceleration; Particle Sources and Detectors; Magnets for ion beam control; Atomic and Nuclear Physics Instrumentation
Rev. Sci. Instrum. 95, 113301 (2024) https://doi.org/10.1063/5.0219086
Rev. Sci. Instrum. 95, 113302 (2024) https://doi.org/10.1063/5.0235400
Rev. Sci. Instrum. 95, 113303 (2024) https://doi.org/10.1063/5.0238136
Equipment and Techniques for Fusion and Inertial and Magnetic Plasmas, Low temperature and Space Plasmas, Plasma Diagnostics
Rev. Sci. Instrum. 95, 113501 (2024) https://doi.org/10.1063/5.0220160
Rev. Sci. Instrum. 95, 113502 (2024) https://doi.org/10.1063/5.0219335
Rev. Sci. Instrum. 95, 113503 (2024) https://doi.org/10.1063/5.0219477
Rev. Sci. Instrum. 95, 113504 (2024) https://doi.org/10.1063/5.0168059
Rev. Sci. Instrum. 95, 113505 (2024) https://doi.org/10.1063/5.0219537
Rev. Sci. Instrum. 95, 113506 (2024) https://doi.org/10.1063/5.0219837
Rev. Sci. Instrum. 95, 113507 (2024) https://doi.org/10.1063/5.0237317
Rev. Sci. Instrum. 95, 113508 (2024) https://doi.org/10.1063/5.0234380
Rev. Sci. Instrum. 95, 113509 (2024) https://doi.org/10.1063/5.0219544
Rev. Sci. Instrum. 95, 113510 (2024) https://doi.org/10.1063/5.0231756
Rev. Sci. Instrum. 95, 113511 (2024) https://doi.org/10.1063/5.0220315
Rev. Sci. Instrum. 95, 113512 (2024) https://doi.org/10.1063/5.0222211
Equipment and Techniques for Microscopy; Imaging Methods; Positioning Systems, Nanoparticles
Rev. Sci. Instrum. 95, 113701 (2024) https://doi.org/10.1063/5.0233276
Rev. Sci. Instrum. 95, 113702 (2024) https://doi.org/10.1063/5.0235243
Rev. Sci. Instrum. 95, 113703 (2024) https://doi.org/10.1063/5.0206286
Rev. Sci. Instrum. 95, 113704 (2024) https://doi.org/10.1063/5.0226633
Rev. Sci. Instrum. 95, 113705 (2024) https://doi.org/10.1063/5.0225904
Rev. Sci. Instrum. 95, 113706 (2024) https://doi.org/10.1063/5.0235081
Rev. Sci. Instrum. 95, 113707 (2024) https://doi.org/10.1063/5.0233223
Rev. Sci. Instrum. 95, 113708 (2024) https://doi.org/10.1063/5.0240046
Rev. Sci. Instrum. 95, 113709 (2024) https://doi.org/10.1063/5.0228902
Equipment and Techniques for Condensed Matter and Materials; Diamond Anvil Cells, and other High-Pressure Equipment, Thin films
Rev. Sci. Instrum. 95, 113901 (2024) https://doi.org/10.1063/5.0227001
Rev. Sci. Instrum. 95, 113902 (2024) https://doi.org/10.1063/5.0213480
Rev. Sci. Instrum. 95, 113903 (2024) https://doi.org/10.1063/5.0225539
Rev. Sci. Instrum. 95, 113904 (2024) https://doi.org/10.1063/5.0222271
Rev. Sci. Instrum. 95, 113905 (2024) https://doi.org/10.1063/5.0235568
Rev. Sci. Instrum. 95, 113906 (2024) https://doi.org/10.1063/5.0232175
Rev. Sci. Instrum. 95, 113907 (2024) https://doi.org/10.1063/5.0231004
Gravity and gravitational waves detection and instrumentation; Geophysics and balloon/space instrumentation; Astronomy and Astrophysics; Satellite Equipment and Propulsion Systems, Remote Sensing
Rev. Sci. Instrum. 95, 114501 (2024) https://doi.org/10.1063/5.0219859
Rev. Sci. Instrum. 95, 114502 (2024) https://doi.org/10.1063/5.0219215
Rev. Sci. Instrum. 95, 114503 (2024) https://doi.org/10.1063/5.0219571
Electronics; Electromagnetic Technology; Microwaves; Power Supplies, Electrical Measurements, and Data Acquisition Devices
Rev. Sci. Instrum. 95, 114701 (2024) https://doi.org/10.1063/5.0219284
Rev. Sci. Instrum. 95, 114702 (2024) https://doi.org/10.1063/5.0202377
Rev. Sci. Instrum. 95, 114703 (2024) https://doi.org/10.1063/5.0223715
Rev. Sci. Instrum. 95, 114704 (2024) https://doi.org/10.1063/5.0222752
Rev. Sci. Instrum. 95, 114705 (2024) https://doi.org/10.1063/5.0225768
Rev. Sci. Instrum. 95, 114706 (2024) https://doi.org/10.1063/5.0227363
Rev. Sci. Instrum. 95, 114707 (2024) https://doi.org/10.1063/5.0237429
Rev. Sci. Instrum. 95, 114708 (2024) https://doi.org/10.1063/5.0231415
Rev. Sci. Instrum. 95, 114709 (2024) https://doi.org/10.1063/5.0225000
Rev. Sci. Instrum. 95, 114710 (2024) https://doi.org/10.1063/5.0231586
Rev. Sci. Instrum. 95, 114711 (2024) https://doi.org/10.1063/5.0230002
Equipment and Techniques for Thermometry; Thermal Diffusivity; Acoustics; Photothermal and Photoacoustic
Rev. Sci. Instrum. 95, 114901 (2024) https://doi.org/10.1063/5.0211033
Sensors; Actuators; Positioning Devices; MEMS/NEMS; Energy Harvesting
Rev. Sci. Instrum. 95, 115001 (2024) https://doi.org/10.1063/5.0201547
General Instruments, General Experimental Techniques or Analyses
Rev. Sci. Instrum. 95, 115101 (2024) https://doi.org/10.1063/5.0215247
Rev. Sci. Instrum. 95, 115102 (2024) https://doi.org/10.1063/5.0226400
Rev. Sci. Instrum. 95, 115103 (2024) https://doi.org/10.1063/5.0213918
Rev. Sci. Instrum. 95, 115104 (2024) https://doi.org/10.1063/5.0219636
Rev. Sci. Instrum. 95, 115105 (2024) https://doi.org/10.1063/5.0225011
Rev. Sci. Instrum. 95, 115106 (2024) https://doi.org/10.1063/5.0222940
Rev. Sci. Instrum. 95, 115107 (2024) https://doi.org/10.1063/5.0223517
Rev. Sci. Instrum. 95, 115108 (2024) https://doi.org/10.1063/5.0227509
Rev. Sci. Instrum. 95, 115109 (2024) https://doi.org/10.1063/5.0225204

NEW PRODUCTS

Rev. Sci. Instrum. 95, 119501 (2024) https://doi.org/10.1063/5.0247829

Park Systems tailored its Park FX200 to offer precision, reliability, and ease of use in atomic force microscopy on 200 mm samples. Its advanced mechanical structure ensures a lower noise floor, minimal thermal drift, and high stability. Faster Z-servo performance and an improved high-power sample view enhance operational efficiency and imaging capabilities. Features such as automatic probe recognition and probe exchange, laser-beam alignment, and macro-optics for full sample view simplify the user experience and maximize productivity. With optical autofocus, navigation, and sequential measurements at multiple coordinates, combined with automated AFM-scan parameter settings and data analysis, the FX200 streamlines complex operations, making it suitable for both research and industrial applications. Park Systems Inc., 3040 Olcott Street, Santa Clara, CA 95054, USA (408-986-1110) https://parksystems.com

ERRATA

Rev. Sci. Instrum. 95, 119901 (2024) https://doi.org/10.1063/5.0245233
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