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Issues
September 2008
ISSN 0034-6748
EISSN 1089-7623
In this Issue
INVITED ARTICLE
Invited Article: Deep Impact instrument calibration
Kenneth P. Klaasen; Michael F. A’Hearn; Michael Baca; Alan Delamere; Mark Desnoyer; Tony Farnham; Olivier Groussin; Donald Hampton; Sergei Ipatov; Jianyang Li; Carey Lisse; Nickolaos Mastrodemos; Stephanie McLaughlin; Jessica Sunshine; Peter Thomas; Dennis Wellnitz
Rev. Sci. Instrum. 79, 091301 (2008)
https://doi.org/10.1063/1.2972112
OPTICS; ATOMS AND MOLECULES; SPECTROSCOPY; PHOTON DETECTORS
High resolution flat crystal spectrometer for the Shanghai EBIT
Rev. Sci. Instrum. 79, 093101 (2008)
https://doi.org/10.1063/1.2970942
PARTICLE SOURCES, OPTICS AND ACCELERATION; PARTICLE DETECTORS
Electron beam diagnostics for a superconducting radio frequency photoelectron injector
Thorsten Kamps; Andre Arnold; Daniel Boehlick; Marc Dirsat; Guido Klemz; Dirk Lipka; Torsten Quast; Jeniffa Rudolph; Mario Schenk; Friedrich Staufenbiel; Jochen Teichert; Ingo Will
Rev. Sci. Instrum. 79, 093301 (2008)
https://doi.org/10.1063/1.2964929
Electrophoresis system for high temperature mobility measurements of nanosize particles
Rev. Sci. Instrum. 79, 093302 (2008)
https://doi.org/10.1063/1.2976779
Measurement of the gamma-ray sensitivity and signal-to-noise ratio of a new scattered-electron detector
Rev. Sci. Instrum. 79, 093303 (2008)
https://doi.org/10.1063/1.2976670
High resolution energy analyzer for broad ion beam characterization
Rev. Sci. Instrum. 79, 093304 (2008)
https://doi.org/10.1063/1.2972175
Development and calibration of a Thomson parabola with microchannel plate for the detection of laser-accelerated MeV ions
K. Harres; M. Schollmeier; E. Brambrink; P. Audebert; A. Blažević; K. Flippo; D. C. Gautier; M. Geißel; B. M. Hegelich; F. Nürnberg; J. Schreiber; H. Wahl; M. Roth
Rev. Sci. Instrum. 79, 093306 (2008)
https://doi.org/10.1063/1.2987687
NUCLEAR PHYSICS, FUSION AND PLASMAS
Development of a high-brightness and low-divergence lithium neutral beam for a Zeeman polarimetry on JT-60U
Rev. Sci. Instrum. 79, 093502 (2008)
https://doi.org/10.1063/1.2964225
A line-of-sight electron cyclotron emission receiver for electron cyclotron resonance heating feedback control of tearing modes
J. W. Oosterbeek; A. Bürger; E. Westerhof; M. R. de Baar; M. A. van den Berg; W. A. Bongers; M. F. Graswinckel; B. A. Hennen; O. G. Kruijt; J. Thoen; R. Heidinger; S. B. Korsholm; F. Leipold; S. K. Nielsen
Rev. Sci. Instrum. 79, 093503 (2008)
https://doi.org/10.1063/1.2976665
Absolute intensity calibration of the Wendelstein 7-X high efficiency extreme ultraviolet overview spectrometer system
Rev. Sci. Instrum. 79, 093504 (2008)
https://doi.org/10.1063/1.2977541
Design and development of detector signal conditioning electronics for SST-1 Thomson scattering system
Rev. Sci. Instrum. 79, 093505 (2008)
https://doi.org/10.1063/1.2972149
Determination of electron-heated temperatures of petawatt laser-irradiated foil targets with 256 and 68 eV extreme ultraviolet imaging
T. Ma; A. G. MacPhee; M. H. Key; S. P. Hatchett; K. U. Akli; T. W. Barbee; C. D. Chen; R. R. Freeman; J. A. King; A. Link; A. J. Mackinnon; D. T. Offermann; V. Ovchinnikov; P. K. Patel; R. B. Stephens; L. D. Van Woerkom; B. Zhang; F. N. Beg
Rev. Sci. Instrum. 79, 093507 (2008)
https://doi.org/10.1063/1.2987683
Design and implementation of a 120 GHz tracking interferometer with near diffraction limited focal spot
Rev. Sci. Instrum. 79, 093509 (2008)
https://doi.org/10.1063/1.2987690
Development of a simple 2.45 GHz microwave plasma with a repulsive double hexapole configuration
Rev. Sci. Instrum. 79, 093510 (2008)
https://doi.org/10.1063/1.2987694
A flexible luminescent probe to monitor fast ion losses at the edge of the TJ-II stellarator
D. Jiménez-Rey; B. Zurro; J. Guasp; M. Liniers; A. Baciero; M. García-Muñoz; A. Fernández; G. García; L. Rodríguez-Barquero; J. M. Fontdecaba
Rev. Sci. Instrum. 79, 093511 (2008)
https://doi.org/10.1063/1.2979013
MICROSCOPY AND IMAGING
Design criteria for scanning tunneling microscopes to reduce the response to external mechanical disturbances
Rev. Sci. Instrum. 79, 093704 (2008)
https://doi.org/10.1063/1.2979008
CONDENSED MATTER; MATERIALS
A constant-current electrospinning system for production of high quality nanofibers
Rev. Sci. Instrum. 79, 093904 (2008)
https://doi.org/10.1063/1.2981699
A surface-sensitive UHV dielectric spectrometer for studies of nanoscale molecular systems on a planar surface
Rev. Sci. Instrum. 79, 093905 (2008)
https://doi.org/10.1063/1.2981309
A compact UHV deposition system for in situ study of ultrathin films via hard x-ray scattering and spectroscopy
Rev. Sci. Instrum. 79, 093908 (2008)
https://doi.org/10.1063/1.2982059
A frequency-adjustable electromagnet for hyperthermia measurements on magnetic nanoparticles
Rev. Sci. Instrum. 79, 093909 (2008)
https://doi.org/10.1063/1.2972172
Three-dimensional finite element thermal analysis of dental tissues irradiated with Er,Cr:YSGG laser
Rev. Sci. Instrum. 79, 093910 (2008)
https://doi.org/10.1063/1.2953526
CHEMISTRY
Experimental setup for characterization of self-actuated microcantilevers with piezoresistive readout for chemical recognition of volatile substances
Denis Filenko; Tzvetan Ivanov; Burkhard E. Volland; Katerina Ivanova; Ivo W. Rangelow; Nikolay Nikolov; Teodor Gotszalk; Jerzy Mielczarski
Rev. Sci. Instrum. 79, 094101 (2008)
https://doi.org/10.1063/1.2976038
A new crossed molecular beam apparatus using time-sliced ion velocity imaging technique
Rev. Sci. Instrum. 79, 094104 (2008)
https://doi.org/10.1063/1.2978004
BIOLOGY AND MEDICINE
GRAVITY; GEOPHYSICS; ASTRONOMY AND ASTROPHYSICS
A liquid metal flume for free surface magnetohydrodynamic experiments
Rev. Sci. Instrum. 79, 094501 (2008)
https://doi.org/10.1063/1.2976109
ELECTRONICS; ELECTROMAGNETIC TECHNOLOGY; MICROWAVES
Design of a simple annular electron beam source and its operating characteristics in single and repetitive shot modes
Rev. Sci. Instrum. 79, 094701 (2008)
https://doi.org/10.1063/1.2976753
Dielectric microwave resonators in cavities for electron paramagnetic resonance spectroscopy
Rev. Sci. Instrum. 79, 094702 (2008)
https://doi.org/10.1063/1.2976033
Handheld Flyback driven coaxial dielectric barrier discharge: Development and characterization
Rev. Sci. Instrum. 79, 094707 (2008)
https://doi.org/10.1063/1.2988833
THERMOMETRY; THERMAL DIFFUSIVITY; ACOUSTIC; PHOTOTHERMAL AND PHOTOACOUSTIC
Pulse compression approach to infrared nondestructive characterization
Rev. Sci. Instrum. 79, 094901 (2008)
https://doi.org/10.1063/1.2976673
GENERAL INSTRUMENTS
Lateral shearing interferometer for measuring photoinduced refractive index change in
Rev. Sci. Instrum. 79, 095101 (2008)
https://doi.org/10.1063/1.2973640
Adapting a triple-axis spectrometer for small angle neutron scattering measurements
Rev. Sci. Instrum. 79, 095102 (2008)
https://doi.org/10.1063/1.2969254
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Rev. Sci. Instrum. 79, 095105 (2008)
https://doi.org/10.1063/1.2987695
An automated submicron beam profiler for characterization of high numerical aperture optics
Rev. Sci. Instrum. 79, 095106 (2008)
https://doi.org/10.1063/1.2991112
NOTES
Optical lever calibration in atomic force microscope with a mechanical lever
Rev. Sci. Instrum. 79, 096101 (2008)
https://doi.org/10.1063/1.2976108
A simple and flexible thin film evaporating device for energetic materials
Rev. Sci. Instrum. 79, 096102 (2008)
https://doi.org/10.1063/1.2978390
Implementation of maskless laser lithography using a Raman spectroscopy microprobe
Rev. Sci. Instrum. 79, 096103 (2008)
https://doi.org/10.1063/1.2981701
Design of a high temperature sensing system using luminescence lifetime measurement
Rev. Sci. Instrum. 79, 096104 (2008)
https://doi.org/10.1063/1.2981704
Initial and adhesive contact between a diamond indenter and polydimethylsiloxane
Rev. Sci. Instrum. 79, 096106 (2008)
https://doi.org/10.1063/1.2987692
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
Automated polarization rotation for multi-axis rotational-anisotropy second harmonic generation experiments
Karna A. Morey, Bryan T. Fichera, et al.
Measurement setup for the characterization of integrated semiconductor circuits at cryogenic temperatures
P. J. Ritter, M.-A. Tucholke, et al.