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Antenna for unidirectional propagation of fast Alfvén waves in a tokamak
Rev. Sci. Instrum. 56, 1151–1155 (1985)
https://doi.org/10.1063/1.1138020
Measurement of the wall radiation in soft x‐ray region in PDX
Rev. Sci. Instrum. 56, 1160–1164 (1985)
https://doi.org/10.1063/1.1138022
Tokamak Fusion Test Reactor horizontal high‐resolution Bragg x‐ray spectrometer
K. W. Hill; M. Bitter; M. Tavernier; M. Diesso; S. von Goeler; G. Johnson; L. C. Johnson; N. R. Sauthoff; N. Schechtman; S. Sesnic; F. Tenney; K. M. Young
Rev. Sci. Instrum. 56, 1165–1168 (1985)
https://doi.org/10.1063/1.1138023
Repeating pneumatic hydrogen pellet injector for plasma fueling
Rev. Sci. Instrum. 56, 1173–1178 (1985)
https://doi.org/10.1063/1.1138025
Microchannel‐plate photomultiplier applicability to the time‐correlated photon‐counting method
Rev. Sci. Instrum. 56, 1187–1194 (1985)
https://doi.org/10.1063/1.1138027
Fluorescence rejection in Raman spectroscopy by a gated single‐photon counting method
Rev. Sci. Instrum. 56, 1195–1198 (1985)
https://doi.org/10.1063/1.1138028
Rapid scanning fluorometer based on constant energy synchronous scanning
Rev. Sci. Instrum. 56, 1199–1205 (1985)
https://doi.org/10.1063/1.1138029
Sample positioner and deflection energy analyzer for measurements of photofield emission
Rev. Sci. Instrum. 56, 1206–1211 (1985)
https://doi.org/10.1063/1.1138030
Normal‐incidence grating spectrograph with large acceptance for inverse photoemission
Rev. Sci. Instrum. 56, 1212–1214 (1985)
https://doi.org/10.1063/1.1137977
Improved instrument for medium energy electron diffraction and microscopy of surfaces
Rev. Sci. Instrum. 56, 1215–1219 (1985)
https://doi.org/10.1063/1.1137978
Properties of industrial‐grade platinum–cobalt resistance thermometers between 1 and 27 K
Rev. Sci. Instrum. 56, 1232–1235 (1985)
https://doi.org/10.1063/1.1137982
New target cell design for alkali and alkaline earth vapor scattering experiments
Rev. Sci. Instrum. 56, 1248–1252 (1985)
https://doi.org/10.1063/1.1137985
Electron beam system for rapid isothermal annealing of semiconductor materials and devices
Rev. Sci. Instrum. 56, 1257–1261 (1985)
https://doi.org/10.1063/1.1137987
Modification to the HP 4274/75A LCR meters for investigation of device admittance under heavy forward bias conditions
Rev. Sci. Instrum. 56, 1265–1268 (1985)
https://doi.org/10.1063/1.1137989
Apparatus for sound velocity measurements in gases up to 10 kbar: Experimental data for argon
Rev. Sci. Instrum. 56, 1269–1273 (1985)
https://doi.org/10.1063/1.1137990
Effects of thermal loading on pressure measurement in a combustion bomb
Rev. Sci. Instrum. 56, 1274–1278 (1985)
https://doi.org/10.1063/1.1137991
Construction and novel application of a flat flame burner facility to study hazardous waste combustion
Rev. Sci. Instrum. 56, 1279–1284 (1985)
https://doi.org/10.1063/1.1137992
Extended travel ultrahigh‐vacuum sample manipulator with two orthogonal, independent rotations
Rev. Sci. Instrum. 56, 1285–1287 (1985)
https://doi.org/10.1063/1.1137993
Ultrahigh‐vacuum evaporation system with low‐temperature measurement capability
Rev. Sci. Instrum. 56, 1288–1290 (1985)
https://doi.org/10.1063/1.1137994
Instrument to collect fogwater for chemical analysis
Rev. Sci. Instrum. 56, 1291–1293 (1985)
https://doi.org/10.1063/1.1137995