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High‐Resolution Polarizing Microscope for the Observation of Magnetic Structures at Low Temperatures
Rev. Sci. Instrum. 44, 379–382 (1973)
https://doi.org/10.1063/1.1686138
A Sampling Linear Detector for Accurate rf Pulse Amplitude Measurement
Rev. Sci. Instrum. 44, 383–390 (1973)
https://doi.org/10.1063/1.1686139
Application of Channel Multiplier Plates as Image Information Preprocessors
Rev. Sci. Instrum. 44, 400–405 (1973)
https://doi.org/10.1063/1.1686143
Coaxial Anode for Background Suppression in X‐Ray Proportional Counters
Rev. Sci. Instrum. 44, 418–422 (1973)
https://doi.org/10.1063/1.1686147
Bi2Se3 Hall Effect Magnetometer for Reliable Low Temperature Use
Rev. Sci. Instrum. 44, 434–437 (1973)
https://doi.org/10.1063/1.1686151
Poly(halo)styrene Thin‐Film Dosimeters for High Doses
Rev. Sci. Instrum. 44, 443–452 (1973)
https://doi.org/10.1063/1.1686153
Quasimodo—A Device for Suspending Small Solid Targets at the Focus of a High Power Laser
Rev. Sci. Instrum. 44, 453–456 (1973)
https://doi.org/10.1063/1.1686154
A ``Differential Reflectometer'' for Measurements of Small Differences in Reflectivity
Rev. Sci. Instrum. 44, 463–466 (1973)
https://doi.org/10.1063/1.1686156
Digital Correlation Technique for Third Order Intensity Correlation Measurements of Light
Rev. Sci. Instrum. 44, 466–470 (1973)
https://doi.org/10.1063/1.1686157
An Absolute Method of Measuring Energy Outputs from CO2 Lasers
Rev. Sci. Instrum. 44, 471–474 (1973)
https://doi.org/10.1063/1.1686158
Simple Methods For High‐Resolution Scanning of Laser Beams And Alignment of Small Spatial Filtered Beams
Rev. Sci. Instrum. 44, 475–477 (1973)
https://doi.org/10.1063/1.1686159
An Isothermal Titration Microcalorimeter
Rev. Sci. Instrum. 44, 481–484 (1973)
https://doi.org/10.1063/1.1686161
A Simple Automatic Conductance Bridge for Measuring the Rates of Chemical Reactions in Solution
Rev. Sci. Instrum. 44, 494–496 (1973)
https://doi.org/10.1063/1.1686165
A High Resolution Dynamic Technique of Thermoelectric Power Measurements
Rev. Sci. Instrum. 44, 497–505 (1973)
https://doi.org/10.1063/1.1686166
Notes
A High‐Angle Tilting Stage for the 650 kV Hitachi Electron Microscope
Rev. Sci. Instrum. 44, 511–512 (1973)
https://doi.org/10.1063/1.1686169
An Informative Method for Recording Partial Discharges in Insulating Materials
Rev. Sci. Instrum. 44, 519–520 (1973)
https://doi.org/10.1063/1.1686175
An ion-imaging detector for high count rates
Kai Golibrzuch, Florian Nitz, et al.
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
Line-scan imaging for real-time phenotypic screening of C.
elegans
Aaron Au, Maximiliano Giuliani, et al.