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Issues
November 1971
ISSN 0034-6748
EISSN 1089-7623
In this Issue
Application of the Faraday Method to Magnetic Measurements under Pressure
Rev. Sci. Instrum. 42, 1573–1578 (1971)
https://doi.org/10.1063/1.1684942
Alternating Current Losses in Thin Film Superconductors: New Calorimetric Measurement Technique
Rev. Sci. Instrum. 42, 1584–1589 (1971)
https://doi.org/10.1063/1.1684944
Measurement of Laser Energy of Linear Components of Polarization at 1.060 μ
Rev. Sci. Instrum. 42, 1590–1593 (1971)
https://doi.org/10.1063/1.1684945
Improvement of Photon Counting by Means of a Pulse Height Analyzer
Rev. Sci. Instrum. 42, 1594–1596 (1971)
https://doi.org/10.1063/1.1684946
A Sensitive Calorimetric Method for Scanning Measurements of the Optical Absorption of Metals and Alloys
Rev. Sci. Instrum. 42, 1596–1601 (1971)
https://doi.org/10.1063/1.1684947
Cylindrical Mirror Analyzer with Surface Entrance and Exit Slots. I. Nonrelativistic Part
Rev. Sci. Instrum. 42, 1601–1606 (1971)
https://doi.org/10.1063/1.1684948
A Technique for the Direct Observation of Filaments in Electron Microscopes
Rev. Sci. Instrum. 42, 1623–1626 (1971)
https://doi.org/10.1063/1.1684953
Recording Flash X‐Ray Burst Times with Scintillation Crystals
Rev. Sci. Instrum. 42, 1627–1629 (1971)
https://doi.org/10.1063/1.1684954
Determination of Ion Transit Times in an Ion Cyclotron Resonance Spectrometer
Rev. Sci. Instrum. 42, 1632–1638 (1971)
https://doi.org/10.1063/1.1684956
Production of Polydisperse Sprays
Rev. Sci. Instrum. 42, 1648–1649 (1971)
https://doi.org/10.1063/1.1684959
Windowless Photoelectron Spectrometer for High Resolution Studies of Solids and Surfaces
Rev. Sci. Instrum. 42, 1670–1674 (1971)
https://doi.org/10.1063/1.1684964
Apparatus for Measuring the Normal Hall Coefficient in Magnetic Conductors
Rev. Sci. Instrum. 42, 1674–1676 (1971)
https://doi.org/10.1063/1.1684965
Selected Microarea Electron Diffraction Technique in High Voltage Electron Microscopy and Some Metallurgical Applications
Rev. Sci. Instrum. 42, 1676–1682 (1971)
https://doi.org/10.1063/1.1684966
Compensation of Source Fluctuations in Raman Spectroscopy by Quick Analog Dividing
Rev. Sci. Instrum. 42, 1683–1686 (1971)
https://doi.org/10.1063/1.1684967
A New Device for the Maximum Electrochemical Thinning of Metal Disks
Rev. Sci. Instrum. 42, 1687–1691 (1971)
https://doi.org/10.1063/1.1684968
A Single‐Coil Probe Damper for Pulsed Nuclear Magnetic Resonance
Rev. Sci. Instrum. 42, 1692–1693 (1971)
https://doi.org/10.1063/1.1684969
Fabrication of Sputtering Sources by Plasma Spraying: Tantalum‐Hafnium Mixtures
Rev. Sci. Instrum. 42, 1696–1698 (1971)
https://doi.org/10.1063/1.1684971
Notes
A Versatile Easily Constructed Thermostat for Temperatures between ‐100 and +200°C
Rev. Sci. Instrum. 42, 1706–1707 (1971)
https://doi.org/10.1063/1.1684975
High Frequency, Low Amplitude Strain Measurement with Strain Gauges
Rev. Sci. Instrum. 42, 1713–1715 (1971)
https://doi.org/10.1063/1.1684979
Simplified Adjustable SQUID
Rev. Sci. Instrum. 42, 1717–1718 (1971)
https://doi.org/10.1063/1.1684981
An Improved Burner Design for Testing Dynamic Burning Properties of Solid Propellants
Rev. Sci. Instrum. 42, 1718–1719 (1971)
https://doi.org/10.1063/1.1684982
The Rotated Hot Wire Anemometer
Rev. Sci. Instrum. 42, 1720–1721 (1971)
https://doi.org/10.1063/1.1684983
Fast Rejuvenation of Copper‐Beryllium Multipliers Used with Mass Spectrometers
Rev. Sci. Instrum. 42, 1725–1726 (1971)
https://doi.org/10.1063/1.1684986
Quantitative Spectroscopy—Reproducible Production of Thin Layers on Supports from Solutions
Rev. Sci. Instrum. 42, 1726–1727 (1971)
https://doi.org/10.1063/1.1684987
Response of Activated Thallium Chloride as a Scintillation Spectrometer for High Energy Electrons
Rev. Sci. Instrum. 42, 1727–1728 (1971)
https://doi.org/10.1063/1.1684988
Method of Measuring the Optical Transmission of Microcrystals at Low Temperatures Using a Casting Resin
Rev. Sci. Instrum. 42, 1732–1733 (1971)
https://doi.org/10.1063/1.1684992
Channel Electron Multiplier Operation in the Continuous Current Mode
Rev. Sci. Instrum. 42, 1733–1734 (1971)
https://doi.org/10.1063/1.1684993
Simple Methods for Determining m/z of Particles in Quasistationary Plasmas
Rev. Sci. Instrum. 42, 1734–1736 (1971)
https://doi.org/10.1063/1.1684994
Measurement of Temperature Dependence of Dielectric Constants: A New Technique as Applied to KI
Rev. Sci. Instrum. 42, 1738–1739 (1971)
https://doi.org/10.1063/1.1684997
Letter to the Editor
Comments on ``A Simplified Technique for Crystal Alignment during Channeling Effect Measurements''
Rev. Sci. Instrum. 42, 1740 (1971)
https://doi.org/10.1063/1.1684999
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J. Kirsch, Joshua Martin, et al.
Rydberg electromagnetically induced transparency based laser lock to Zeeman sublevels with 0.6 GHz scanning range
Alexey Vylegzhanin, Síle Nic Chormaic, et al.