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Issues
Low Temperature Electrical Resistivity Measurements on Reactive Samples
Rev. Sci. Instrum. 40, 420–422 (1969)
https://doi.org/10.1063/1.1683962
Scanning Electron Diffraction Attachment with Electron Energy Filtering
Rev. Sci. Instrum. 40, 424–433 (1969)
https://doi.org/10.1063/1.1683964
Apparatus for High‐Pressure High‐Temperature X‐Ray Powder Diffraction Studies
Rev. Sci. Instrum. 40, 434–437 (1969)
https://doi.org/10.1063/1.1683965
The Use of a Multichannel Scaler in Electron Attachment‐Detachment Experiments
Rev. Sci. Instrum. 40, 461–462 (1969)
https://doi.org/10.1063/1.1683970
Lumped Element Line Generators to Produce Pulsed Sinusoidal Oscillations of Very Large Power
Rev. Sci. Instrum. 40, 473–482 (1969)
https://doi.org/10.1063/1.1683974
Notes
Construction and Performance of High Resolution Silicon Surface Barrier Detectors
Rev. Sci. Instrum. 40, 497–498 (1969)
https://doi.org/10.1063/1.1683980
Triangular Sawtooth Sweep for NMR with Provision for Manual Operation or Time Averaging
Rev. Sci. Instrum. 40, 499–500 (1969)
https://doi.org/10.1063/1.1683981
Improvement of Spectral Baseline Stability for a Time‐of‐Flight Mass Spectrometer Operated at Elevated Pressures
Rev. Sci. Instrum. 40, 503–504 (1969)
https://doi.org/10.1063/1.1683984
A Solid State Ozone Generator
Rev. Sci. Instrum. 40, 505–506 (1969)
https://doi.org/10.1063/1.1683986
Degradation of the Time Characteristics of Surface Barrier Detectors with Fission Fragment Dose
Rev. Sci. Instrum. 40, 507–509 (1969)
https://doi.org/10.1063/1.1683988
A Simple Gas Recirculation Pump for Low Flow and High Pressure Applications
Rev. Sci. Instrum. 40, 513–514 (1969)
https://doi.org/10.1063/1.1683994
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J. Kirsch, Joshua Martin, et al.
A glovebox-integrated confocal microscope for quantum sensing in inert atmosphere
Kseniia Volkova, Abhijeet M. Kumar, et al.