A soft x-ray (SX) diagnostic system has been designed and installed in JT-60SA for the first plasma. For quantitative measurement, the etendue of each viewing chord was evaluated analytically and numerically. The electron temperature is evaluated from the detected bremsstrahlung emission ratio between two detector arrays with two different thicknesses of Be filters. The two filter thicknesses were optimized to be 7 and 50 μm for the expected electron temperature range of 0–3 keV. The one-dimensional profile of SX emission is reconstructed from line integrated emission by the elliptic Abel inversion scheme. For a plasma discharge with a plasma current of 1 MA, a peaked electron temperature profile with about 800 eV at the center is obtained. The total bremsstrahlung power was also evaluated using the electron temperature profile and the absolutely evaluated etendue of each viewing chord. In this evaluation, the bremsstrahlung power is around 10% of ohmic heating power.
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July 2024
Research Article|
July 25 2024
Soft x-ray diagnostics system for electron temperature measurement in the integrated commissioning phase of JT-60SA
Ryuichi Sano
;
Ryuichi Sano
a)
(Conceptualization, Formal analysis, Investigation, Visualization, Writing – original draft, Writing – review & editing)
Naka Institute, National Institutes for Quantum Science and Technology
, Naka 311-0193, Japan
a)Author to whom correspondence should be addressed: [email protected]
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Hiroto Homma
;
Hiroto Homma
(Data curation, Methodology, Visualization)
Naka Institute, National Institutes for Quantum Science and Technology
, Naka 311-0193, Japan
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Manabu Takechi;
Manabu Takechi
(Conceptualization, Methodology, Resources, Visualization)
Naka Institute, National Institutes for Quantum Science and Technology
, Naka 311-0193, Japan
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Tomohide Nakano
Tomohide Nakano
(Conceptualization, Investigation, Methodology, Supervision)
Naka Institute, National Institutes for Quantum Science and Technology
, Naka 311-0193, Japan
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a)Author to whom correspondence should be addressed: [email protected]
Rev. Sci. Instrum. 95, 073532 (2024)
Article history
Received:
April 24 2024
Accepted:
July 10 2024
Citation
Ryuichi Sano, Hiroto Homma, Manabu Takechi, Tomohide Nakano; Soft x-ray diagnostics system for electron temperature measurement in the integrated commissioning phase of JT-60SA. Rev. Sci. Instrum. 1 July 2024; 95 (7): 073532. https://doi.org/10.1063/5.0215598
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