We have developed a sensor for simultaneous measurement of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) under liquid environments. The sensor, which is based on the qPlus sensor, is equipped with an insulated conductive tip. Owing to its electrical insulation except for the tip apex, the developed sensor enabled simultaneous detection of tip–sample interaction force and tunneling current, suppressing the Faradaic leakage current. As a fundamental demonstration, we performed simultaneous AFM/STM imaging in an electrolyte solution by using the developed sensor.
REFERENCES
1.
S.
Morita
, F. J.
Giessibl
, E.
Meyer
, and R.
Wiesendanger
, Noncontact Atomic Force Microscopy
, 3
(Springer
, 2015
).2.
B.
Voigtländer
, Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
(Springer
, 2015
).3.
P.
Güthner
, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom.
14
, 2428
(1996
).4.
A.
Oral
, R. A.
Grimble
, H. Ö.
Özer
, P. M.
Hoffmann
, and J. B.
Pethica
, Appl. Phys. Lett.
79
, 1915
(2001
).5.
D.
Sawada
, Y.
Sugimoto
, K.
Morita
, M.
Abe
, and S.
Morita
, Appl. Phys. Lett.
94
, 173117
(2009
).6.
A.
Sweetman
, A.
Stannard
, Y.
Sugimoto
, M.
Abe
, S.
Morita
, and P.
Moriarty
, Phys. Rev. B
87
, 075310
(2013
).7.
O.
Stetsovych
, M.
Todorovic
, T. K.
Shimizu
, C.
Moreno
, J. W.
Ryan
, C. P.
León
, K.
Sagisaka
, E.
Palomares
, V.
Matolín
, D.
Fujita
, R.
Perez
, and O.
Custance
, Nat. Commun.
6
, 7265
(2015
).8.
C.
Loppacher
, M.
Guggisberg
, O.
Pfeiffer
, E.
Meyer
, M.
Bammerlin
, R.
Lüthi
, R.
Schlittler
, J. K.
Gimzewski
, H.
Tang
, and C.
Joachim
, Phys. Rev. Lett.
90
, 066107
(2003
).9.
Y.
Sugimoto
, K.
Ueda
, M.
Abe
, and S.
Morita
, J. Phys.: Condens. Matter
24
, 084008
(2012
).10.
K.
Itaya
, Prog. Surf. Sci.
58
, 121
(1998
).11.
R.
Wiesendanger
and H. J.
Güntherodt
, Scanning Tunneling Microscopy II
(Springer
, 1992
).12.
F. J.
Giessibl
, Appl. Phys. Lett.
73
, 3956
(1998
).13.
F. J.
Giessibl
, Appl. Phys. Lett.
76
, 1470
(2000
).14.
E.
Wutscher
and F. J.
Giessibl
, Rev. Sci. Instrum.
82
, 093703
(2011
).15.
T.
Ichii
, M.
Fujimura
, M.
Negami
, K.
Murase
, and H.
Sugimura
, Jpn. J. Appl. Phys.
51
, 08KB08
(2012
).16.
D. S.
Wastl
, A. J.
Weymouth
, and F. J.
Giessibl
, ACS Nano
8
, 5233
(2014
).17.
K.
Pürckhauer
, A. J.
Weymouth
, K.
Pfeffer
, L.
Kullmann
, E.
Mulvihill
, M. P.
Krahn
, D. J.
Müller
, and F. J.
Giessibl
, Sci. Rep.
8
, 9330
(2018
).18.
Y.
Sugimoto
, I.
Yi
, K.
Morita
, M.
Abe
, and S.
Morita
, Appl. Phys. Lett.
96
, 263114
(2010
).19.
Y.
Sugimoto
, Y.
Nakajima
, D.
Sawada
, K.
Morita
, M.
Abe
, and S.
Morita
, Phys. Rev. B
81
, 245322
(2010
).© 2023 Author(s). Published under an exclusive license by AIP Publishing.
2023
Author(s)
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