Next-generation synchrotron radiation facilities, such as the Advanced Photon Source Upgrade (APS-U), bring significant advancements in scientific research capabilities, necessitating advanced diagnostic tools. Central to these diagnostics are x-ray wavefront sensors, crucial for preserving beam properties, including brightness, coherence, and stability. This paper presents two novel wavefront sensor prototypes developed at the APS using the coded-mask-based technique. The first is a compact design tailored for specific conditions and adaptability to diverse beamline configurations. The second, an adjustable zoom version, offers flexibility to accommodate a wide range of beam conditions. Both prototypes underwent rigorous testing at the APS 28-ID-B beamline and demonstrated their effectiveness in both absolute wavefront sensing and relative metrology modes. These results highlight their promise in beamline diagnostics, potentially enabling applications such as beamline auto-alignment and real-time wavefront manipulation.

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