To investigate photoinduced phenomena in various materials and molecules, ultrashort pulsed x-ray and electron sources with high brightness and high repetition rates are required. The x-ray and electron’s typical and de Broglie wavelengths are shorter than lattice constants of materials and molecules. Therefore, photoinduced structural dynamics on the femtosecond to picosecond timescales can be directly observed in a diffraction manner by using these pulses. This research created a tabletop ultrashort pulsed electron diffraction setup that used a femtosecond laser and electron pulse compression cavity that was directly synchronized to the microwave master oscillator (∼3 GHz). A compressed electron pulse with a 1 kHz repetition rate contained 228 000 electrons. The electron pulse duration was estimated to be less than 100 fs at the sample position by using photoinduced immediate lattice changes in an ultrathin silicon film (50 nm). The newly developed time-resolved electron diffraction setup has a pulse duration that is comparable to femtosecond laser pulse widths (35–100 fs). The pulse duration, in particular, fits within the timescale of photoinduced phenomena in quantum materials. Our developed ultrafast time-resolved electron diffraction setup with a sub-100 fs temporal resolution would be a powerful tool in material science with a combination of optical pump–probe, time-resolved photoemission spectroscopic, and pulsed x-ray measurements.
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May 31 2022
Generation of sub-100 fs electron pulses for time-resolved electron diffraction using a direct synchronization method
Kou Takubo
;
Kou Takubo
a)
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
a)Authors to whom correspondence should be addressed: takubo.k.ab@m.titech.ac.jp; hada.masaki.fm@u.tsukuba.ac.jp; and koshihara.s.aa@m.titech.ac.jp
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Samiran Banu
;
Samiran Banu
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
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Sichen Jin;
Sichen Jin
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
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Misaki Kaneko;
Misaki Kaneko
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
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Wataru Yajima;
Wataru Yajima
2
Faculty of Pure and Applied Sciences, University of Tsukuba
, Tsukuba 305-8573, Japan
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Makoto Kuwahara
;
Makoto Kuwahara
3
Department of Applied Physics and Institute of Materials and Systems for Sustainability, Nagoya University
, Nagoya 464-8603, Japan
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Yasuhiko Hayashi
;
Yasuhiko Hayashi
4
Research Institute for Interdisciplinary Science, Okayama University
, Okayama 700-8530, Japan
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Tadahiko Ishikawa
;
Tadahiko Ishikawa
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
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Yoichi Okimoto
;
Yoichi Okimoto
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
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Masaki Hada
;
Masaki Hada
a)
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
2
Faculty of Pure and Applied Sciences, University of Tsukuba
, Tsukuba 305-8573, Japan
5
Tsukuba Research Center for Energy Materials Science (TREMS), University of Tsukuba
, Tsukuba 305-8573, Japan
a)Authors to whom correspondence should be addressed: takubo.k.ab@m.titech.ac.jp; hada.masaki.fm@u.tsukuba.ac.jp; and koshihara.s.aa@m.titech.ac.jp
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Shinya Koshihara
Shinya Koshihara
a)
1
Department of Chemistry, Tokyo Institute of Technology
, Tokyo 152-8551, Japan
a)Authors to whom correspondence should be addressed: takubo.k.ab@m.titech.ac.jp; hada.masaki.fm@u.tsukuba.ac.jp; and koshihara.s.aa@m.titech.ac.jp
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a)Authors to whom correspondence should be addressed: takubo.k.ab@m.titech.ac.jp; hada.masaki.fm@u.tsukuba.ac.jp; and koshihara.s.aa@m.titech.ac.jp
Rev. Sci. Instrum. 93, 053005 (2022)
Article history
Received:
January 21 2022
Accepted:
May 01 2022
Citation
Kou Takubo, Samiran Banu, Sichen Jin, Misaki Kaneko, Wataru Yajima, Makoto Kuwahara, Yasuhiko Hayashi, Tadahiko Ishikawa, Yoichi Okimoto, Masaki Hada, Shinya Koshihara; Generation of sub-100 fs electron pulses for time-resolved electron diffraction using a direct synchronization method. Rev. Sci. Instrum. 1 May 2022; 93 (5): 053005. https://doi.org/10.1063/5.0086008
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