We developed a compact sized device for angular and energy analysis of charged particles in a wide acceptance cone angle of nearly 1π steradian. This device is configured from an electrostatic lens comprising an axisymmetric aspherical mesh, which has a concave shape viewed from the point source, a set of axisymmetric electrodes, planar grids, microchannel plates, and a fluorescent screen positioned coaxially. The potentials of electrodes are adjusted so that the trajectories of the electrons with arbitrarily set kinetic energy are substantially parallelized by the electrostatic lens and enter the planar grid perpendicularly. Instead of the planar grid, a collimator plate with parallel holes can be used as an energy band-pass filter. The angular distribution of electrons with the selected kinetic energy is projected directly onto the fluorescent screen without converging and passing through a pinhole. This is a simple but significant electron-optical design to obtain wide-range angular distribution with high angular resolution, and the analyzer can be suitably used for the two-dimensional angular distribution measurements of electrons and ions emitted from surfaces.
Skip Nav Destination
Projection-type electron spectroscopy collimator analyzer for charged particles and x-ray detections
Article navigation
July 2021
Research Article|
July 01 2021
Projection-type electron spectroscopy collimator analyzer for charged particles and x-ray detections
Fumihiko Matsui
;
Fumihiko Matsui
a)
UVSOR Synchrotron Facility, Institute for Molecular Science
, Okazaki, Aichi 444-8585, Japan
Search for other works by this author on:
Hiroyuki Matsuda
Hiroyuki Matsuda
a)
UVSOR Synchrotron Facility, Institute for Molecular Science
, Okazaki, Aichi 444-8585, Japan
Search for other works by this author on:
Rev. Sci. Instrum. 92, 073301 (2021)
Article history
Received:
March 22 2021
Accepted:
June 08 2021
Citation
Fumihiko Matsui, Hiroyuki Matsuda; Projection-type electron spectroscopy collimator analyzer for charged particles and x-ray detections. Rev. Sci. Instrum. 1 July 2021; 92 (7): 073301. https://doi.org/10.1063/5.0051114
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
New Display‐type Analyzer for Three‐dimensional Fermi Surface Mapping and Atomic Orbital Analysis
AIP Conference Proceedings (January 2007)
High-power collimated laser-plasma source for proximity x-ray nanolithography
J. Vac. Sci. Technol. B (January 2003)
Upgrade of the DIANE: Performance improvement in thermalization of fast neutrons for radiography
AIP Conference Proceedings (February 1997)
Modelling and Simulation of the Advanced Plasma Source
J. Appl. Phys. (August 2011)