Frequency-modulation atomic force microscopy (AFM) with a qPlus sensor allows one to atomically resolve surfaces in a variety of environments ranging from low-temperature in ultra-high vacuum to ambient and liquid conditions. Typically, the tip is driven to oscillate vertically, giving a measure of the vertical force component. However, for many systems, the lateral force component provides valuable information about the sample. Measuring lateral and vertical force components simultaneously by oscillating vertically and laterally has so far only been demonstrated with relatively soft silicon cantilevers and optical detection. Here, we show that the qPlus sensor can be used in a biaxial mode with electrical detection by making use of the first flexural mode and the length extensional mode. We describe the necessary electrode configuration as well as the electrical detection circuit and compare the length extensional mode to the needle sensor. Finally, we show atomic resolution in ambient conditions of a mica surface and in ultra-high vacuum of a silicon surface. In addition to this, we show how any qPlus AFM setup can be modified to work as a biaxial sensor, allowing two independent force components to be recorded.
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April 2021
Research Article|
April 05 2021
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes
Dominik Kirpal
;
Dominik Kirpal
a)
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
a)Author to whom correspondence should be addressed: dominik.kirpal@physik.uni-r.de
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Jinglan Qiu
;
Jinglan Qiu
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
2
College of Physics and Hebei Key Laboratory of Photophysics Research and Application, Hebei Normal University
, Shijiazhuang, Hebei 050024, China
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Korbinian Pürckhauer
;
Korbinian Pürckhauer
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
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Alfred J. Weymouth
;
Alfred J. Weymouth
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
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Michael Metz
;
Michael Metz
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
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Franz J. Giessibl
Franz J. Giessibl
1
Institute of Experimental and Applied Physics, University of Regensburg
, D-93053 Regensburg, Germany
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a)Author to whom correspondence should be addressed: dominik.kirpal@physik.uni-r.de
Rev. Sci. Instrum. 92, 043703 (2021)
Article history
Received:
December 22 2020
Accepted:
March 14 2021
Citation
Dominik Kirpal, Jinglan Qiu, Korbinian Pürckhauer, Alfred J. Weymouth, Michael Metz, Franz J. Giessibl; Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes. Rev. Sci. Instrum. 1 April 2021; 92 (4): 043703. https://doi.org/10.1063/5.0041369
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