We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer. The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for the development of debris mitigation schemes in a soft x-ray microscope.
Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source
Hiromu Kawasaki, Toshiki Tamura, Atsushi Sunahara, Masaharu Nishikino, Shinichi Namba, Gerry O’Sullivan, Takeshi Higashiguchi; Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source. Rev. Sci. Instrum. 1 August 2020; 91 (8): 086103. https://doi.org/10.1063/5.0012225
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