A hybrid scanning tunneling/optical near-field microscope is presented, in which an optical fiber tip coated with 100 nm thick Ag/Cr films scans the surface. The tip metallization enables operating the instrument via a current-based distance control and guarantees sub-nanometer spatial resolution in the topographic channel. The fiber tip simultaneously serves as nanoscale light source, given the optical transparency of the metal coating. The emission response of the tip–sample junction is collected with two parabolic mirrors and probed with a far-field detector. To test the capabilities of the new setup, the evolution of the optical signal is monitored when the tip approaches a gold surface. The intensity rise and frequency shift of the emission provide evidence for the development of coupled plasmon modes in the tip–sample cavity. Photon mapping is employed to probe the optical inhomogeneity of Ru(0001) and TiO2(110) surfaces covered with silver deposits. While the 2D Ag flakes on Ru give rise to a near-field enhancement, the 3D particles on titania locally damp the gap plasmons and lower the emitted intensity. The lateral resolution in the optical channel has been estimated to be ∼1 nm, and optical and topographic signals are well correlated. Our fiber microscope thus appears to be suitable for probing optical surface properties at the nanoscale.
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July 2020
Research Article|
July 23 2020
A fiber scanning tunneling microscope for optical analysis at the nanoscale
René Jakob;
René Jakob
Carl von Ossietzky Universität, Institut für Physik
, D-26111 Oldenburg, Germany
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Niklas Nilius
Niklas Nilius
a)
Carl von Ossietzky Universität, Institut für Physik
, D-26111 Oldenburg, Germany
a)Present address: University of Oldenburg, Oldenburg, Germany. Author to whom correspondence should be addressed: [email protected]. Telephone: +49-441-798-3152
Search for other works by this author on:
Carl von Ossietzky Universität, Institut für Physik
, D-26111 Oldenburg, Germany
a)Present address: University of Oldenburg, Oldenburg, Germany. Author to whom correspondence should be addressed: [email protected]. Telephone: +49-441-798-3152
Rev. Sci. Instrum. 91, 073110 (2020)
Article history
Received:
March 28 2020
Accepted:
July 05 2020
Citation
René Jakob, Niklas Nilius; A fiber scanning tunneling microscope for optical analysis at the nanoscale. Rev. Sci. Instrum. 1 July 2020; 91 (7): 073110. https://doi.org/10.1063/5.0009182
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