A 300 keV transmission electron microscope was modified to produce broadband pulsed beams that can be, in principle, between 40 MHz and 12 GHz, corresponding to temporal resolution in the nanosecond to picosecond range without an excitation laser. The key enabling technology is a pair of phase-matched modulating and de-modulating traveling wave metallic comb striplines (pulsers). An initial temporal resolution of 30 ps was achieved with a strobe frequency of 6.0 GHz. The placement of the pulsers, mounted immediately below the gun, allows for preservation of all optical configurations, otherwise available to the unmodified instrument, and therefore makes such a post-modified instrument for dual-use, i.e., both pulsed-beam mode (i.e., stroboscopic time-resolved) and conventional continuous waveform mode. In this article, we describe the elements inserted into the beam path, challenges encountered during integration with an in-service microscope, and early results from an electric-field-driven pump–probe experiment. We conclude with ideas for making this class of instruments broadly applicable for examining cyclical and repeatable phenomena.
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Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements
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February 2020
Research Article|
February 24 2020
Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements

June W. Lau
;
June W. Lau
a)
1
Materials Science and Engineering Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
a)Author to whom correspondence should be addressed: [email protected]
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Karl B. Schliep;
Karl B. Schliep
1
Materials Science and Engineering Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
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Michael B. Katz;
Michael B. Katz
1
Materials Science and Engineering Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
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Vikrant J. Gokhale
;
Vikrant J. Gokhale
2
Microsystems and Nanotechnology Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
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Jason J. Gorman;
Jason J. Gorman
2
Microsystems and Nanotechnology Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
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Chunguang Jing;
Chunguang Jing
b)
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Ao Liu;
Ao Liu
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Yubin Zhao;
Yubin Zhao
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Eric Montgomery;
Eric Montgomery
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Hyeokmin Choe;
Hyeokmin Choe
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Wade Rush;
Wade Rush
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Alexei Kanareykin;
Alexei Kanareykin
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
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Xuewen Fu;
Xuewen Fu
4
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory
, Upton, New York 11973, USA
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June W. Lau
1,a)
Karl B. Schliep
1
Michael B. Katz
1
Vikrant J. Gokhale
2
Jason J. Gorman
2
Chunguang Jing
3,b)
Ao Liu
3
Yubin Zhao
3
Eric Montgomery
3
Hyeokmin Choe
3
Wade Rush
3
Alexei Kanareykin
3
Xuewen Fu
4
Yimei Zhu
4,c)
1
Materials Science and Engineering Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
2
Microsystems and Nanotechnology Division, National Institute of Standards and Technology
, Gaithersburg, Maryland 20899, USA
3
Euclid Techlabs, LLC
, 365 Remington Blvd., Bolingbrook, Illinois 60440, USA
4
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory
, Upton, New York 11973, USA
a)Author to whom correspondence should be addressed: [email protected]
b)
Electronic mail: [email protected]
c)
Electronic mail: [email protected]
Rev. Sci. Instrum. 91, 021301 (2020)
Article history
Received:
October 15 2019
Accepted:
February 01 2020
Connected Content
A companion article has been published:
Laser-less TEM provides time-resolved images of cyclical phenomena
Citation
June W. Lau, Karl B. Schliep, Michael B. Katz, Vikrant J. Gokhale, Jason J. Gorman, Chunguang Jing, Ao Liu, Yubin Zhao, Eric Montgomery, Hyeokmin Choe, Wade Rush, Alexei Kanareykin, Xuewen Fu, Yimei Zhu; Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements. Rev. Sci. Instrum. 1 February 2020; 91 (2): 021301. https://doi.org/10.1063/1.5131758
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