Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx–ky images, typically exceeding a full Brillouin zone. As energy filters, double-hemispherical or time-of-flight (ToF) devices are in use. Here, we present a new approach for momentum mapping of the full half-space, based on a large single hemispherical analyzer (path radius of 225 mm). Excitation by an unfocused He lamp yielded an energy resolution of 7.7 meV. The performance is demonstrated by k-imaging of quantum-well states in Au and Xe multilayers. The α2-aberration term (α, entrance angle in the dispersive plane) and the transit-time spread of the electrons in the spherical field are studied in a large pass-energy (6 eV–660 eV) and angular range (α up to ±7°). It is discussed how the method circumvents the preconditions of previous theoretical work on the resolution limitation due to the α2-term and the transit-time spread, being detrimental for time-resolved experiments. Thanks to k-resolved detection, both effects can be corrected numerically. We introduce a dispersive-plus-ToF hybrid mode of operation, with an imaging ToF analyzer behind the exit slit of the hemisphere. This instrument captures 3D data arrays I (EB, kx, ky), yielding a gain up to N2 in recording efficiency (N being the number of resolved time slices). A key application will be ARPES at sources with high pulse rates such as synchrotrons with 500 MHz time structure.
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December 2020
Research Article|
December 17 2020
Single-hemisphere photoelectron momentum microscope with time-of-flight recording
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G. Schönhense
;
G. Schönhense
a)
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
a)Author to whom correspondence should be addressed: [email protected]
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S. Babenkov;
S. Babenkov
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
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D. Vasilyev;
D. Vasilyev
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
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H.-J. Elmers
;
H.-J. Elmers
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
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K. Medjanik
K. Medjanik
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
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G. Schönhense
a)
S. Babenkov
D. Vasilyev
H.-J. Elmers
K. Medjanik
Johannes Gutenberg-Universität, Institut für Physik
, 55128 Mainz, Germany
a)Author to whom correspondence should be addressed: [email protected]
Rev. Sci. Instrum. 91, 123110 (2020)
Article history
Received:
August 04 2020
Accepted:
November 26 2020
Citation
G. Schönhense, S. Babenkov, D. Vasilyev, H.-J. Elmers, K. Medjanik; Single-hemisphere photoelectron momentum microscope with time-of-flight recording. Rev. Sci. Instrum. 1 December 2020; 91 (12): 123110. https://doi.org/10.1063/5.0024074
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