Positive and negative hydrogen ion reflections from surfaces by injecting singly charged hydrogen ion beams show a clear difference between atomic and molecular ion injections at low energy and grazing incidence. The intensity ratio of reflected negative to positive ions H−/H+ increased as the incident beam energy per nucleon decreased only when molecular ion beams are injected. It implies that negative ions are more produced upon beam-surface interaction when molecules are injected. A possible reason was discussed in terms of difference in the negative ion production processes between atomic and molecular ions.
Positive and negative hydrogen ion reflections of low-energy atomic and molecular hydrogen ion beam from HOPG and Mo surfaces
Note: Contributed paper, published as part of the Proceedings of the 18th International Conference on Ion Sources, Lanzhou, China, September 2019.
Nozomi Tanaka, Fumiya Ikemoto, Ippei Yamada, Yuji Shimabukuro, Masashi Kisaki, Wilson Agerico Diño, Mamiko Sasao, Motoi Wada, Hitoshi Yamaoka; Positive and negative hydrogen ion reflections of low-energy atomic and molecular hydrogen ion beam from HOPG and Mo surfaces. Rev. Sci. Instrum. 1 January 2020; 91 (1): 013313. https://doi.org/10.1063/1.5129576
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