The Laser Shock Station in the Dynamic Compression Sector (DCS) [Advanced Photon Source (APS), Argonne National Laboratory] links a laser-driven shock compression platform with high energy x-ray pulses from the APS to achieve in situ, time-resolved x-ray measurements (diffraction and imaging) in materials subjected to well-characterized, high stress, short duration shock waves. This station and the other DCS experimental stations provide a unique and versatile facility to study condensed state phenomena subjected to shocks with a wide range of amplitudes (to above ∼350 GPa) and time-durations (∼10 ns–1 µs). The Laser Shock Station uses a 100 J, 5–17 ns, 351 nm frequency tripled Nd:glass laser with programmable pulse shaping and focal profile smoothing for maximum precision. The laser can operate once every 30 min. The interaction chamber has multiple diagnostic ports, a sample holder to expose 14 samples without breaking vacuum, can vary the angle between the x-ray and laser beams by 135°, and can translate to select one of the two types of x-ray beams. The x-ray measurement temporal resolution is ∼90 ps. The system is capable of reproducible, well-characterized experiments. In a series of 10 shots, the absolute variation in shock breakout times was less than 500 ps. The variation in peak particle velocity at the sample/window interface was 4.3%. This paper describes the entire DCS Laser Shock Station, including sample fabrication and diagnostics, as well as experimental results from shock compressed tantalum that demonstrate the facility’s capability for acquiring high quality x-ray diffraction data.

1.
D.
Broege
,
S.
Fochs
,
G.
Brent
 et al., “
The dynamic compression sector laser: A 100-J UV laser for dynamic compression research
,”
Rev. Sci. Instrum.
90
,
053001
(
2019
).
2.
D.
Montgomery
, “
Two decades of progress in understanding and control of laser plasma instabilities in indirect drive inertial fusion
,”
Phys. Plasmas
23
,
055601
(
2016
).
3.
M.
Hohenberger
 et al., “
Optical smoothing of laser imprinting in planar-target experiments on OMEGA EP using multi-FM 1-D smoothing by spectral dispersion
,”
Phys. Plasmas
23
,
092702
(
2016
).
4.
See https://ops.aps.anl.gov/SRparameters/SRparameters.html for APS Storage Ring Parameters.
5.
T.
Graber
 et al., “
BioCARS: A synchrotron resource for time-resolved x-ray science
,”
J. Synchrotron Radiat.
18
,
658
(
2011
).
6.
J.
Nudell
,
D.
Capatina
,
N.
Poindexter
,
T.
Graber
,
D.
Paskvan
, and
S.
Marathe
, “
Design and testing of the millisecond shutter at the dynamic compression beamline (DCS) at the advanced photon source (APS)
,” in
Proceedings of Mechanical Engineering Design of Synchrotron Radiation Equipment (MEDSI 2014)
,
2014
.
7.
M.
Cammarata
,
L.
Eybert
,
F.
Ewald
 et al., “
Chopper system for time resolved experiments with synchrotron radiation
,”
Rev. Sci. Instrum.
80
,
015101
(
2009
).
8.
See https://nationalenergetics.com/technology/disc-amplifiers/ for more information on active cooling solutions for disc amplifiers.
9.
See https://shop.focenter.com/ngstrombond-ab9110lv-room-temp-cure-epoxy-2-5g for details of the epoxy used to bond sample layers together.
10.
See http://www.pacothane.com/pdfs/PacoTherm-TriPak-TDS-2018_R1.pdf for specifications of the press pads used to equalize pressure during the sample bonding stage.
11.
See http://www.fujifilm.com/products/prescale/prescalefilm/ for information on the pressure sensitive film used to confirm that uniform pressure was being applied to each sample during the bonding stage.
12.
See https://www.carverpress.com/ for specifications of the press used to hold sample layers together while the adhesive cures.
13.
See https://epics.anl.gov/index.php for more information on EPICS. EPICS is an acronym for “Experimental Physics and Industrial Control System,” and has been developed by Argonne National Laboratory.
14.
See http://henke.lbl.gov/optical_constants/filter2.html for the tool used to calculate x-ray transmission through polycarbonate.
15.
L. M.
Barker
and
R. E.
Hollenbach
,
J. Appl. Phys.
41
,
4208
(
1970
).
16.
L. M.
Barker
and
R. E.
Hollenbach
,
J. Appl. Phys.
43
,
4669
(
1972
).
17.
W. F.
Hemsing
,
Rev. Sci. Instrum.
50
,
73
(
1979
).
18.
P. A.
Rigg
,
M. D.
Knudson
,
R. J.
Scharff
, and
R. S.
Hixson
,
J. Appl. Phys.
116
,
033515
(
2014
).
19.
A. C.
Mitchell
and
W. J.
Nellis
,
J. Appl. Phys.
52
,
3363
(
1981
).
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