Progress is being made in the development of an Ion Source Test Facility (ISTF) by D-Pace Inc. in collaboration with Buckley Systems Ltd. in Auckland, NZ. The first phase of the ISTF is to be commissioned in October 2015 with the second phase being commissioned in March 2016. The facility will primarily be used for the development and the commercialization of ion sources. It will also be used to characterize and further develop various D-Pace Inc. beam diagnostic devices.
A negative ion source test facility
S. Melanson, M. Dehnel, D. Potkins, J. Theroux, C. Hollinger, J. Martin, C. Philpott, T. Stewart, P. Jackle, P. Williams, S. Brown, T. Jones, B. Coad, S. Withington; A negative ion source test facility. Rev. Sci. Instrum. 1 February 2016; 87 (2): 02B109. https://doi.org/10.1063/1.4932320
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