We report on the design of an ion source for the production of single and double charged Helium ions with kinetic energies in the range from 300 eV down to 5 eV. The construction is based on a commercial sputter ion gun equipped with a Wien-filter for mass/charge separation. Retardation of the ions from the ionizer potential (2 keV) takes place completely within the lens system of the sputter gun, without modification of original parts. For 15 eV He+ ions, the design allows for beam currents up to 30 nA, limited by the space charge repulsion in the beam. For He2 + operation, we obtain a beam current of 320 pA at 30 eV, and 46 pA at 5 eV beam energy, respectively. In addition, operating parameters can be optimized for a significant contribution of metastable He*+ (2s) ions.
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June 2014
Research Article|
June 27 2014
A low energy ion source for electron capture spectroscopy
C. Tusche;
C. Tusche
a)
1
Max-Planck-Institut für Mikrostrukturphysik
, Weinberg 2, 06120 Halle, Germany
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J. Kirschner
J. Kirschner
1
Max-Planck-Institut für Mikrostrukturphysik
, Weinberg 2, 06120 Halle, Germany
2Naturwissenschaftliche Fakultät II,
Martin-Luther-Universität Halle-Wittenberg
, 06120 Halle, Germany
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a)
Electronic mail: tusche@mpi-halle.mpg.de
Rev. Sci. Instrum. 85, 063305 (2014)
Article history
Received:
April 09 2014
Accepted:
June 11 2014
Citation
C. Tusche, J. Kirschner; A low energy ion source for electron capture spectroscopy. Rev. Sci. Instrum. 1 June 2014; 85 (6): 063305. https://doi.org/10.1063/1.4884900
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