A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 Å. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasma width, the estimated resolving power will be around 1400 at 221.15 Å.
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June 2014
Research Article|
June 17 2014
A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs Available to Purchase
Zhan Shi;
Zhan Shi
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Ruifeng Zhao;
Ruifeng Zhao
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Wenxian Li;
Wenxian Li
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Bingsheng Tu;
Bingsheng Tu
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Yang Yang;
Yang Yang
a)
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Jun Xiao;
Jun Xiao
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Sven Huldt;
Sven Huldt
3Lund Observatory,
Lund University
, Lund SE-22100, Sweden
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Roger Hutton;
Roger Hutton
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Yaming Zou
Yaming Zou
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
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Zhan Shi
1,2
Ruifeng Zhao
1,2
Wenxian Li
1,2
Bingsheng Tu
1,2
Yang Yang
1,2,a)
Jun Xiao
1,2
Sven Huldt
3
Roger Hutton
1,2
Yaming Zou
1,2
1EBIT Laboratory, Institute of Modern Physics,
Fudan University
, Shanghai 200433, People's Republic of China
2The Key Laboratory of Applied Ion Beam Physics (Ministry of Education),
Fudan University
, Shanghai 200433, People's Republic of China
3Lund Observatory,
Lund University
, Lund SE-22100, Sweden
a)
Electronic mail: [email protected]
Rev. Sci. Instrum. 85, 063110 (2014)
Article history
Received:
March 12 2014
Accepted:
May 03 2014
Citation
Zhan Shi, Ruifeng Zhao, Wenxian Li, Bingsheng Tu, Yang Yang, Jun Xiao, Sven Huldt, Roger Hutton, Yaming Zou; A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs. Rev. Sci. Instrum. 1 June 2014; 85 (6): 063110. https://doi.org/10.1063/1.4876597
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