The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.
Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates
Aday J. Molina-Mendoza, José G. Rodrigo, Joshua Island, Enrique Burzuri, Gabino Rubio-Bollinger, Herre S. J. van der Zant, Nicolás Agraït; Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates. Rev. Sci. Instrum. 1 February 2014; 85 (2): 026105. https://doi.org/10.1063/1.4864196
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