We have developed an atom trap trace analysis (ATTA) system to measure Kr in Xe at the part per trillion (ppt) level, a prerequisite for the sensitivity achievable with liquid xenon dark matter detectors beyond the current generation. Since Ar and Kr have similar laser cooling wavelengths, the apparatus has been tested with Ar to avoid contamination prior to measuring Xe samples. A radio-frequency plasma discharge generates a beam of metastable atoms which is optically collimated, slowed, and trapped using standard magneto-optical techniques. Based on the measured overall system efficiency of 1.2 × 10−8 (detection mode), we expect the ATTA system to reach the design goal sensitivity to ppt concentrations of Kr in Xe in <2 h.
REFERENCES
1.
E.
Aprile
et al. and XENON100 Collaboration
, Phys. Rev. Lett.
109
, 181301
(2012
).2.
E.
Aprile
and XENON1T Collaboration, “The XENON1T Dark Matter Search Experiment
,” preprint arXiv:1206.6288 [astro-ph.IM] (2012
).3.
H.
Oeschger
and M.
Wahlen
, Annu. Rev. Nucl. Sci.
25
, 423
(1975
).4.
A.
Dobi
, C.
Davis
, C.
Hall
, T.
Langford
, S.
Slutsky
, and Y.-R.
Yen
, Nucl. Instrum. Methods Phys. Res. A
665
, 1
(2011
).5.
A. E.
Litherland
, Annu. Rev. Nucl. Part. Sci.
30
, 437
(1980
).6.
C. Y.
Chen
, Y. M.
Li
, K.
Bailey
, T. P.
O’Connor
, L.
Young
, and Z.-T.
Lu
, Science
286
, 1139
(1999
).7.
D. N.
McKinsey
and C.
Orzel
, Nucl. Instrum. Methods Phys. Res. A
545
, 524
(2005
).8.
W.
Vassen
, C.
Cohen-Tannoudji
, M.
Leduc
, D.
Boiron
, C. I.
Westbrook
, A.
Truscott
, K.
Baldwin
, G.
Birkl
, P.
Cancio
, and M.
Trippenbach
, Rev. Mod. Phys.
84
, 175
(2012
).9.
W.
Jiang
, W.
Williams
, K.
Bailey
, A. M.
Davis
, S.-M.
Hu
, Z.-T.
Lu
, T. P.
O’Connor
, R.
Purtschert
, N. C.
Sturchio
, Y. R.
Sun
, and P.
Mueller
, Phys. Rev. Lett.
106
, 103001
(2011
).10.
P.
Collon
, W.
Kutschera
, and Z.-T.
Lu
, Annu. Rev. Nucl. Part. Sci.
54
, 39
(2004
).11.
X.
Du
, R.
Purtschert
, K.
Bailey
, B. E.
Lehmann
, R.
Lorenzo
, Z.-T.
Lu
, P.
Mueller
, T. P.
O’Connor
, N. C.
Sturchio
, and L.
Young
, Geophys. Res. Lett.
30
, 2068
, doi: (2003
).12.
G. M.
Yang
, C. F.
Cheng
, W.
Jiang
, Z. T.
Lu
, R.
Purtschert
, Y. R.
Sun
, L. Y.
Tu
, and S. M.
Hu
, Sci. Rep.
3
, Article No. 1596
(2013
).13.
C. Y.
Chen
, K.
Bailey
, Y. M.
Li
, T. P.
O’Connor
, Z.-T.
Lu
, X.
Du
, L.
Young
, and G.
Winkler
, Rev. Sci. Instrum.
72
, 271
(2001
).14.
W. W.
Macalpine
and R. O.
Schildknecht
, Proc. IRE
47
, 2099
(1959
).15.
C. I.
Sukenik
and H. C.
Busch
, Rev. Sci. Instrum.
73
, 493
(2002
).16.
U.
Kortshagen
, N. D.
Gibson
, and J. E.
Lawler
, J. Phys. D: Appl. Phys.
29
, 1224
(1996
).17.
M. P.
Gordon
and P. R.
Selvin
, Rev. Sci. Instrum.
74
, 1150
(2003
).18.
19.
A. M.
Steane
, M.
Chowdhury
, and C. J.
Foot
, J. Opt. Soc. Am. B
9
, 2142
(1992
).20.
S.
Lindemann
and H.
Simgen
, “Krypton assay in xenon at the ppq level using a gas chromatographic system combined with a mass spectrometer
,” preprint arXiv:1308.4806 [physics.ins-det] (2013
).21.
K.
Rudinger
, Z.-T.
Lu
, and P.
Mueller
, Rev. Sci. Instrum.
80
, 036105
(2009
).© 2013 AIP Publishing LLC.
2013
AIP Publishing LLC
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