Scanning probe microscopies typically rely on coarse-approach slip-stick piezoelectric motors that work by exciting piezoelectric stacks with sawtooth signals of hundreds of V and some kHz. For this application, we introduce a single-polarity high-voltage amplifier based on discrete MOSFET-technology components with improved output current desirable for low-temperature actuation. The amplifier has an output signal of 600 V, 100 mA output current, noise level below 2 μV/

$\sqrt{{\rm Hz}}$
Hz ⁠, 4 kHz high-voltage bandwidth, 2 V/μs slew-rate, and rise and fall times of 80 μs (when loaded with 30 nF). The circuit was successfully applied to drive a home-made scanning tunnelling microscope.

1.
G.
Binnig
and
H.
Rohrer
,
Helv. Phys. Acta
55
,
726
(
1982
).
2.
D. W.
Pohl
,
W.
Denk
, and
M.
Lanz
,
Appl. Phys. Lett.
44
,
651
(
1984
).
3.
G.
Binnig
,
C. F.
Quate
, and
C.
Gerber
,
Phys. Rev. Lett.
56
,
930
(
1986
).
4.
Y.
Martin
and
K.
Wickramasinghe
,
Appl. Phys. Lett.
50
,
1455
(
1987
).
5.
D. W.
Pohl
,
Rev. Sci. Instrum.
58
,
54
(
1987
).
6.
Ph.
Niedermann
,
R.
Emch
, and
P.
Descouts
,
Rev. Sci. Instrum.
59
,
368
(
1988
).
7.
J. W.
Lyding
,
S.
Skala
,
J. S.
Hubacek
,
R.
Brockenbrough
, and
G.
Gammie
,
Rev. Sci. Instrum.
59
,
1897
(
1988
).
8.
Ch.
Renner
,
Ph.
Niedermann
,
A. D.
Kent
, and
Ø.
Fischer
,
Rev. Sci. Instrum.
61
,
965
(
1990
).
9.
S. H.
Pan
,
E. W.
Hudson
, and
J. C.
Davis
,
Rev. Sci. Instrum.
70
,
1459
(
1999
).
10.
Nanonis, Scanning Probe Microscopy Control System.
11.
RHK Technology, Inc., Scanning Probe Microscopy Control Systems.
12.
A. J.
Fleming
,
Rev. Sci. Instrum.
80
,
104701
(
2009
).
13.
K.
Chatterjee
,
M. C.
Boyer
,
W. D.
Wise
, and
E. W.
Hudson
,
Rev. Sci. Instrum.
80
,
095110
(
2009
).
14.
M. S.
Colclough
,
Rev. Sci. Instrum.
71
,
4323
(
2000
).
15.
L. M.
Eng
,
F.
Eng
,
Ch.
Seuret
,
A.
Kündig
, and
P.
Günter
,
Rev. Sci. Instrum.
67
,
401
(
1996
).
16.
C.
Barchesi
,
R.
Generosi
, and
A.
Cricenti
,
Rev. Sci. Instrum.
64
,
3521
(
1993
).
17.
V.
Strom
,
R. D.
Gomez
,
J.
Nogues
,
B.
Rodell
, and
K. V.
Rao
,
Meas. Sci. Technol.
6
,
1072
(
1995
).
18.
D. V.
Pelekhov
,
J. B.
Becker
, and
G.
Nunes
, Jr.
,
Rev. Sci. Instrum.
70
,
114
(
1999
).
You do not currently have access to this content.