We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of |$8 \times 10^6{\rm spins}/\sqrt{\rm Hz}$| at room temperature.
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October 2013
Research Article|
October 31 2013
The electrically detected magnetic resonance microscope: Combining conductive atomic force microscopy with electrically detected magnetic resonance
Konrad Klein;
Konrad Klein
a)
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Benedikt Hauer;
Benedikt Hauer
b)
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Benedikt Stoib;
Benedikt Stoib
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Markus Trautwein;
Markus Trautwein
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Sonja Matich;
Sonja Matich
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Hans Huebl;
Hans Huebl
2
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, Walther-Meißner-Str. 8, 85748 Garching, Germany
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Oleksandr Astakhov;
Oleksandr Astakhov
3IEK5-Photovoltaik,
Forschungszentrum Jülich
, Leo-Brandt-Straße, 52425 Jülich, Germany
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Friedhelm Finger;
Friedhelm Finger
3IEK5-Photovoltaik,
Forschungszentrum Jülich
, Leo-Brandt-Straße, 52425 Jülich, Germany
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Robert Bittl;
Robert Bittl
4
Freie Universität Berlin
, Fachbereich Physik, Arnimallee 14, 14195 Berlin, Germany
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Martin Stutzmann;
Martin Stutzmann
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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Martin S. Brandt
Martin S. Brandt
1Walter Schottky Institut,
Technische Universität München
, Am Coulombwall 4, 85748 Garching, Germany
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a)
Author to whom correspondence should be addressed. Electronic mail: konrad.klein@wsi.tum.de
b)
Present address: I. Physikalisches Institut, RWTH Aachen, 52056 Aachen, Germany.
Rev. Sci. Instrum. 84, 103911 (2013)
Article history
Received:
August 14 2013
Accepted:
October 12 2013
Citation
Konrad Klein, Benedikt Hauer, Benedikt Stoib, Markus Trautwein, Sonja Matich, Hans Huebl, Oleksandr Astakhov, Friedhelm Finger, Robert Bittl, Martin Stutzmann, Martin S. Brandt; The electrically detected magnetic resonance microscope: Combining conductive atomic force microscopy with electrically detected magnetic resonance. Rev. Sci. Instrum. 1 October 2013; 84 (10): 103911. https://doi.org/10.1063/1.4827036
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