Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.
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October 2012
Research Article|
July 20 2012
Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibrationa)
A. Kappatou;
1FOM Institute DIFFER - Dutch Institute for Fundamental Energy Research,
Association EURATOM-FOM
, 3430 BE Nieuwegein, The Netherlands
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R. J. E. Jaspers;
R. J. E. Jaspers
2Science and Technology of Nuclear Fusion,
Eindhoven University of Technology
, 5600 MB Eindhoven, The Netherlands
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E. Delabie;
E. Delabie
1FOM Institute DIFFER - Dutch Institute for Fundamental Energy Research,
Association EURATOM-FOM
, 3430 BE Nieuwegein, The Netherlands
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O. Marchuk;
O. Marchuk
3
Institute for Energy and Climate Research
, Forschungszentrum Julich GmbH, Trilateral Euregio Cluster, 52425 Julich, Germany
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W. Biel;
W. Biel
3
Institute for Energy and Climate Research
, Forschungszentrum Julich GmbH, Trilateral Euregio Cluster, 52425 Julich, Germany
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M. A. Jakobs
M. A. Jakobs
2Science and Technology of Nuclear Fusion,
Eindhoven University of Technology
, 5600 MB Eindhoven, The Netherlands
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a)
Contributed paper, published as part of the Proceedings of the 19th Topical Conference on High-Temperature Plasma Diagnostics, Monterey, California, May 2012.
Rev. Sci. Instrum. 83, 10D519 (2012)
Article history
Received:
May 07 2012
Accepted:
June 09 2012
Citation
A. Kappatou, R. J. E. Jaspers, E. Delabie, O. Marchuk, W. Biel, M. A. Jakobs; Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration. Rev. Sci. Instrum. 1 October 2012; 83 (10): 10D519. https://doi.org/10.1063/1.4732847
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