A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°–88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα1 line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.
Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector
Evgeny Kleymenov, Jeroen A. van Bokhoven, Christian David, Pieter Glatzel, Markus Janousch, Roberto Alonso-Mori, Marco Studer, Markus Willimann, Anna Bergamaschi, Beat Henrich, Maarten Nachtegaal; Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector. Rev. Sci. Instrum. 1 June 2011; 82 (6): 065107. https://doi.org/10.1063/1.3600452
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