A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ⩽10−10 mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.
REFERENCES
1.
W. A.
Hofer
, A. S.
Foster
, and A. L.
Shluger
, Rev. Mod. Phys.
75
, 1287
(2003
).2.
C. J.
Chen
, Introduction to Scanning Tunneling Microscopy
(Oxford University Press
, New York
, 1993
).3.
F. J.
Giessibl
, Appl. Phys. Lett.
76
, 1470
(2000
).4.
J. P.
Ibe
, J. P. P.
Bey
, S. L.
Brandow
, R. A.
Brizzolara
, N. A.
Burnham
, D. P.
DiLella
, K. P.
Lee
, C. R. K.
Marrian
, and R. J.
Colton
, J. Vac. Sci. Technol. A
8
, 3570
(1990
).5.
A. J.
Melmed
, in Fifth International Conference on Scanning Tunneling Microscopy/Spectroscopy
(1991
), Vol. 9
, pp. 601
–608
.6.
M.
Kulawik
, M.
Nowicki
, G.
Thielsch
, L.
Cramer
, H.-P.
Rust
, H.-J.
Freund
, T. P.
Pearl
, and P. S.
Weiss
, Rev. Sci. Instrum.
74
, 1027
(2003
).7.
Z. Q.
Yu
, C. M.
Wang
, Y.
Du
, S.
Thevuthasan
, and I.
Lyubinetsky
, Ultramicroscopy
108
, 873
(2008
).8.
A.-S.
Lucier
, H.
Mortensen
, Y.
Sun
, and P.
Grutter
, Phys. Rev. B
72
, 235420
(2005
).9.
A.-S.
Lucier
, M.S. thesis, McGill University
, 3600 Rue University, Montreal, QC H3A 2T8, Canada, 2004
).10.
J. W.
Johnson
and C. L.
Wu
, J. Electrochem. Soc.
118
, 1909
(1971
).11.
I.
Ekvall
, E.
Wahlström
, D.
Claesson
, H.
Olin
, and E.
Olsson
, Meas. Sci. Technol.
10
, 11
(1999
).12.
Y.
Nakamura
, Y.
Mera
, and K.
Maeda
, Rev. Sci. Instrum.
70
, 3373
(1999
).13.
L.
Anwei
, H.
Xiaotang
, L.
Wenhui
, and J.
Guijun
, Rev. Sci. Instrum.
68
, 3811
(1997
).14.
A.-D.
Muller
, F.
Muller
, M.
Hietschold
, F.
Demming
, J.
Jersch
, and K.
Dickmann
, Rev. Sci. Instrum.
70
, 3970
(1999
).15.
L.
Ottaviano
, L.
Lozzi
, and S.
Santucci
, Rev. Sci. Instrum.
74
, 3368
(2003
).16.
V. T.
Binh
and R.
Uzan
, Surf. Sci.
179
, 540
(1987
).17.
L. N. R. H.
Fowler
, Proc. R. Soc. London, Ser. A
119
, 173
(1928
).18.
T. T.
Tsong
, Atom-Probe Field Ion Microscopy
(Cambridge University Press
, Cambridge, England
, 1990
).19.
H. W.
Fink
, IBM J. Res. Dev.
30
, 460
(1986
).20.
E. W.
Muller
, J. Appl. Phys.
27
, 474
(1956
).21.
E. W.
Müller
and T. T.
Tsong
, Field Ion Microscopy Principles and Applications
(Elsevier
, New York
, 1969
).22.
A.
Moore
, J. Phys. Chem. Solids
23
, 907
(1962
).23.
M.
Rezeq
, J.
Pitters
, and R.
Wolkow
, J. Chem. Phys.
124
, 204716
(2006
).24.
H.-S.
Kuo
, I.-S.
Hwang
, T.-Y.
Fu
, J.-Y.
Wu
, C.-C.
Chang
, and T. T.
Tsong
, Nano Lett.
4
, 2379
(2004
).25.
T.-Y.
Fu
, Y.-R.
Tzeng
, and T. T.
Tsong
, Phys. Rev. B
54
, 5932
(1996
).26.
M.
Greiner
and P.
Kruse
, Rev. Sci. Instrum.
78
, 026104
(2007
).© 2011 American Institute of Physics.
2011
American Institute of Physics
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