We introduce a new type of microscopy which is capable of investigating surface topography and electrical property of conductive and dielectric materials simultaneously on a nanometer scale. The microwave atomic force microscopy is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. As a result, under the noncontact AFM working conditions, we successfully generated a microwave image of a 200-nm Au film coating on a glass wafer substrate with a spatial resolution of 120 nm and a measured voltage difference of 19.2 mV between the two materials.
Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization
Lan Zhang, Yang Ju, Atsushi Hosoi, Akifumi Fujimoto; Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization. Rev. Sci. Instrum. 1 December 2010; 81 (12): 123708. https://doi.org/10.1063/1.3525058
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