The accuracy of the current wavelength meter using optical interferometry is limited by the numbers of fringe counted. To solve this problem, a novel laser wavelength meter based on the measurement of synthetic wavelength is proposed. The unknown wavelength is obtained by measuring the value of synthetic wavelength produced by the unknown and reference wavelengths, and half of this value corresponds to variation of the phase difference between the interference signals of the unknown and reference wavelengths. The optical configuration of the wavelength meter is designed and the measurement principle is analyzed theoretically. To verify its feasibility, three helium-neon lasers’ wavelengths were determined experimentally, and a relative uncertainty on the unknown wavelength of the order of was realized. Accuracy analysis shows that this wavelength meter has the advantage of high accuracy when the unknown wavelength is around the standard laser wavelength recommended by CIPM.
Skip Nav Destination
Article navigation
November 2010
Research Article|
November 08 2010
A novel laser wavelength meter based on the measurement of synthetic wavelength
Liping Yan;
Liping Yan
Nanometer Measurement Laboratory,
Zhejiang Sci-Tech University
, Hangzhou 310018, China
Search for other works by this author on:
Benyong Chen;
Benyong Chen
a)
Nanometer Measurement Laboratory,
Zhejiang Sci-Tech University
, Hangzhou 310018, China
Search for other works by this author on:
Wanfu Yang;
Wanfu Yang
Nanometer Measurement Laboratory,
Zhejiang Sci-Tech University
, Hangzhou 310018, China
Search for other works by this author on:
Ruofei Wei;
Ruofei Wei
Nanometer Measurement Laboratory,
Zhejiang Sci-Tech University
, Hangzhou 310018, China
Search for other works by this author on:
Siwei Zhao
Siwei Zhao
Nanometer Measurement Laboratory,
Zhejiang Sci-Tech University
, Hangzhou 310018, China
Search for other works by this author on:
a)
Electronic mail: [email protected].
Rev. Sci. Instrum. 81, 115104 (2010)
Article history
Received:
April 11 2010
Accepted:
September 07 2010
Citation
Liping Yan, Benyong Chen, Wanfu Yang, Ruofei Wei, Siwei Zhao; A novel laser wavelength meter based on the measurement of synthetic wavelength. Rev. Sci. Instrum. 1 November 2010; 81 (11): 115104. https://doi.org/10.1063/1.3494615
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Overview of the early campaign diagnostics for the SPARC tokamak (invited)
M. L. Reinke, I. Abramovic, et al.
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J. Kirsch, Joshua Martin, et al.
A glovebox-integrated confocal microscope for quantum sensing in inert atmosphere
Kseniia Volkova, Abhijeet M. Kumar, et al.
Related Content
A BIPM/CIPM key comparison covering the calibration of ultrasonic hydrophones over the frequency range 1 MHz to 15 MHz
J Acoust Soc Am (October 2002)
Precision measurement of refractive index of air based on laser synthetic wavelength interferometry with Edlén equation estimation
Rev. Sci. Instrum. (August 2015)
Note: Laser wavelength precision measurement based on a laser synthetic wavelength interferometer
Rev. Sci. Instrum. (August 2016)
High resolution kilometric range optical telemetry in air by radio frequency phase measurement
Rev. Sci. Instrum. (July 2016)
The role of LATU as national metrology institute of Uruguay and its responsibilities
AIP Conference Proceedings (September 2013)