An imaging photoelectron photoion coincidence spectrometer at the vacuum ultraviolet (VUV) beamline of the Swiss Light Source is presented and a few initial measurements are reported. Monochromatic synchrotron VUV radiation ionizes the cooled or thermal gas-phase sample. Photoelectrons are velocity focused, with better than 1 meV resolution for threshold electrons, and also act as start signal for the ion time-of-flight analysis. The ions are accelerated in a relatively low, field, which enables the direct measurement of rate constants in the range. All electron and ion events are recorded in a triggerless multiple-start/multiple-stop setup, which makes it possible to carry out coincidence experiments at event frequencies. As examples, the threshold photoelectron spectrum of the argon dimer and the breakdown diagrams for hydrogen atom loss in room temperature methane and the chlorine atom loss in cold chlorobenzene are shown and discussed.
REFERENCES
1.
2.
J. H. D.
Eland
, Int. J. Mass Spectrom. Ion Phys.
12
, 389
(1973
).3.
R.
Stockbauer
, J. Chem. Phys.
58
, 3800
(1973
).4.
A. S.
Werner
and T.
Baer
, J. Chem. Phys.
62
, 2900
(1975
).5.
B.
Sztáray
and T.
Baer
, Rev. Sci. Instrum.
74
, 3763
(2003
).6.
T.
Baer
, B.
Sztáray
, J. P.
Kercher
, A. F.
Lago
, A.
Bodi
, C.
Skull
, and D.
Palathinkal
, Phys. Chem. Chem. Phys.
7
, 1507
(2005
).7.
K.
Norwood
and C. Y.
Ng
, J. Chem. Phys.
93
, 6440
(1990
).8.
Q.
Zha
, R. N.
Hayes
, T.
Nishimura
, G. G.
Meisels
, and M. L.
Gross
, J. Phys. Chem.
94
, 1286
(1990
).9.
R.
Thissen
, C.
Alcaraz
, J. W.
Hepburn
, M.
Vervloet
, and O.
Dutuit
, Int. J. Mass Spectrom.
199
, 201
(2000
).10.
A.
Bodi
, J. P.
Kercher
, C.
Bond
, P.
Meteesatien
, B.
Sztáray
, and T.
Baer
, J. Phys. Chem. A
110
, 13425
(2006
).11.
N. S.
Shuman
, M. A.
Ochieng
, B.
Sztáray
, and T.
Baer
, J. Phys. Chem. A
112
, 5647
(2008
).12.
D. M.
Smith
, R. P.
Tuckett
, K. R.
Yoxall
, K.
Codling
, P. A.
Hatherly
, J. F. M.
Aarts
, and M.
Stankiewicz
, J. Chem. Phys.
101
, 10559
(1994
).13.
O.
Dutuit
, T.
Baer
, C.
Metayer
, and J.
Lemaire
, Int. J. Mass Spectrom. Ion Process.
110
, 67
(1991
).14.
J. W.
Keister
, T.
Baer
, R.
Thissen
, C.
Alcaraz
, O.
Dutuit
, H.
Audier
, and V.
Troude
, J. Phys. Chem. A
102
, 1090
(1998
).15.
G. K.
Jarvis
, K. M.
Weitzel
, M.
Malow
, T.
Baer
, Y.
Song
, and C. Y.
Ng
, Rev. Sci. Instrum.
70
, 3892
(1999
).16.
X. M.
Qian
, K. C.
Lau
, G. Z.
He
, C. Y.
Ng
, and M.
Hochlaf
, J. Chem. Phys.
120
, 8476
(2004
).17.
G. K.
Jarvis
, R. C.
Shiell
, J. W.
Hepburn
, Y.
Song
, and C. Y.
Ng
, Rev. Sci. Instrum.
71
, 1325
(2000
).18.
A.
Bodi
, B.
Sztáray
, T.
Baer
, M.
Johnson
, and T.
Gerber
, Rev. Sci. Instrum.
78
, 084102
(2007
).19.
A.
Bodi
, B.
Sztaray
, and T.
Baer
, Phys. Chem. Chem. Phys.
8
, 613
(2006
).20.
J. R.
Buckland
, R. L.
Folkerts
, R. B.
Balsod
, and W.
Allison
, Meas. Sci. Technol.
8
, 933
(1997
).21.
E. E.
Chaban
and J. E.
Reutt-Robey
, Rev. Sci. Instrum.
64
, 2391
(1993
).22.
A.
Stolow
, J. Vac. Sci. Technol. A
14
, 2669
(1996
).23.
J.
Küpper
, H.
Haak
, K.
Wohlfart
, and G.
Meijer
, Rev. Sci. Instrum.
77
, 016106
(2006
).24.
See EPAPS Document No. E-RSINAK-80-049902 for construction drawings for the slim valve, the breakdown diagram of , and the experimental and fitted TOF distributions for and C++ code sections from the measurement software. For more information on EPAPS, see http://www.aip.org/pubservs/epaps.html.
25.
A. T. J. B.
Eppink
and D. H.
Parker
, Rev. Sci. Instrum.
68
, 3477
(1997
).26.
27.
J. A.
Davies
, J. E.
LeClaire
, R. E.
Continetti
, and C. C.
Hayden
, J. Chem. Phys.
111
, 1
(1999
).28.
H. F.
Offerhaus
, C.
Nicole
, F.
Lepine
, C.
Bordas
, F.
Rosca-Pruna
, and M. J. J.
Vrakking
, Rev. Sci. Instrum.
72
, 3245
(2001
).29.
W. A.
Chupka
, J. Chem. Phys.
98
, 4520
(1993
).30.
A. S.
Tremsin
, O. H. W.
Siegmund
, J. V.
Vallerga
, J. S.
Hull
, and R.
Abiad
, IEEE Trans. Nucl. Sci.
51
, 1707
(2004
).31.
A.
Vredenborg
, W. G.
Roeterdink
, and M. H. M.
Janssen
, Rev. Sci. Instrum.
79
, 063108
(2008
).32.
C.
Bordas
, F.
Paulig
, H.
Helm
, and D. L.
Huestis
, Rev. Sci. Instrum.
67
, 2257
(1996
).33.
A.
Osterwalder
, M. J.
Nee
, J.
Zhou
, and D. M.
Neumark
, J. Chem. Phys.
121
, 6317
(2004
).34.
J. Z.
Davalos
, H.
Koizumi
, and T.
Baer
, J. Phys. Chem. A
110
, 5032
(2006
).35.
J.
Ottmar
and A.
Czasch
, personal communication (May 2008
).36.
See http://epics.web.psi.ch for more information about the implementation of EPICS at the Swiss Light Source.
37.
Y.
Ralchenku
, A. E.
Kramida
, J.
Reader
, and NIST ASD Team
, NIST Atomic Spectra Database
(National Institute of Standards and Technology
, Gaithersburg, MD
, 2008
), http://physics.nist.gov/asd3.38.
E. B.
Saloman
and C. J.
Sansonetti
, J. Phys. Chem. Ref. Data
33
, 1113
(2004
).39.
E. B.
Saloman
, J. Phys. Chem. Ref. Data
33
, 765
(2004
).40.
R.
Signorell
and F.
Merkt
, J. Chem. Phys.
109
, 9762
(1998
).41.
W.
Stevens
, B.
Sztáray
, N. S.
Shuman
, T.
Baer
, and J.
Troe
, J. Phys. Chem. A
113
, 573
(2009
).42.
P. M.
Mayer
and T.
Baer
, Int. J. Mass Spectrom. Ion Process.
156
, 133
(1996
).43.
Y. Y.
Youn
, C. H.
Kwon
, J. C.
Choe
, and M. S.
Kim
, J. Chem. Phys.
117
, 2538
(2002
).© 2009 American Institute of Physics.
2009
American Institute of Physics
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