We analyze the determination of the dielectric constant of macroscopic solid samples in a nondestructive way from measurements of the capacitance between a pointer electrode and the sample’s surface. We assembled an experimental device and found that an accuracy of 1% or better can be attained with common laboratory instrumentation.
REFERENCES
1.
C.
Cooke
and J. E.
Ford
, J. Phys. E
14
, 1285
(1981
).2.
R. -j.
Zhang
, S. -g.
Dai
, and P. -a.
Mu
, Meas. Sci. Technol.
8
, 1028
(1997
).3.
C. C.
Williams
, W. P.
Hough
, and S. A.
Rishton
, Appl. Phys. Lett.
55
, 203
(1989
).4.
K.
Goto
and K.
Hane
, J. Appl. Phys.
84
, 4043
(1998
).5.
Š.
Lányi
, Surf. Interface Anal.
27
, 348
(1999
).6.
S.
Gómez-Moñivas
, J. J.
Sáenz
, R.
Carminati
, and J. J.
Greffet
, Appl. Phys. Lett.
76
, 2955
(2000
).7.
K.
Kobayashi
, H.
Yamada
, and K.
Matsushige
, Appl. Phys. Lett.
81
, 2629
(2002
).8.
D. T.
Lee
, J. P.
Pelz
, and B.
Bhushan
, Rev. Sci. Instrum.
73
, 3525
(2002
).9.
D. T.
Lee
, J. P.
Pelz
, and B.
Bhushan
, Nanotechnology
17
, 1484
(2006
).10.
I.
Casuso
, L.
Fumagalli
, E.
Padrós
, and G.
Gomila
, Appl. Phys. Lett.
91
, 063111
(2007
).11.
L.
Fumagalli
, G.
Ferrari
, M.
Sampietro
, and G.
Gomila
, Appl. Phys. Lett.
91
, 243110
(2007
).12.
G.
Gomila
, J.
Toset
, and L.
Fumagalli
, J. Appl. Phys.
104
, 024315
(2008
).© 2009 American Institute of Physics.
2009
American Institute of Physics
You do not currently have access to this content.
