We have developed an atomic force microscopy (AFM) technique that can perform simultaneous normal and shear stiffness measurements of nanoconfined liquids with angstrom-range amplitudes. The AFM technique is based on a fiber-interferometric, small-amplitude, off-resonance AFM. This AFM is capable of providing linear quasistatic measurements of the local mechanical properties of confined liquid layers while only minimally disturbing the layers themselves. A detailed analysis of the measurement geometry reveals that shear stiffness measurements are extremely challenging, as even small deviations from perfect orthogonality can lead to data that is very difficult to interpret. We will show ways out of this dilemma and present results that show simultaneous measurement of the shear and normal stiffness of confined liquid layers.
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February 2008
Research Article|
February 15 2008
Simultaneous normal and shear measurements of nanoconfined liquids in a fiber-based atomic force microscope
George Matei;
George Matei
1Department of Physics,
Wayne State University
, 666 W. Hancock, Detroit Michigan 48201, USA
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Steve Jeffery;
Steve Jeffery
2Department of Materials,
University of Oxford
, Parks Road, Oxford OX1 3PH, United Kingdom
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Shivprasad Patil;
Shivprasad Patil
1Department of Physics,
Wayne State University
, 666 W. Hancock, Detroit Michigan 48201, USA
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Shah H. Khan;
Shah H. Khan
1Department of Physics,
Wayne State University
, 666 W. Hancock, Detroit Michigan 48201, USA
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Mircea Pantea;
Mircea Pantea
1Department of Physics,
Wayne State University
, 666 W. Hancock, Detroit Michigan 48201, USA
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John B. Pethica;
John B. Pethica
2Department of Materials,
University of Oxford
, Parks Road, Oxford OX1 3PH, United Kingdom
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Peter M. Hoffmann
Peter M. Hoffmann
a)
1Department of Physics,
Wayne State University
, 666 W. Hancock, Detroit Michigan 48201, USA
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a)
Electronic mail: hoffmann@wayne.edu.
Rev. Sci. Instrum. 79, 023706 (2008)
Article history
Received:
August 22 2007
Accepted:
January 14 2008
Citation
George Matei, Steve Jeffery, Shivprasad Patil, Shah H. Khan, Mircea Pantea, John B. Pethica, Peter M. Hoffmann; Simultaneous normal and shear measurements of nanoconfined liquids in a fiber-based atomic force microscope. Rev. Sci. Instrum. 1 February 2008; 79 (2): 023706. https://doi.org/10.1063/1.2839913
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